Tatsuaki ISHIJIMA

Person

Tokai, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Specimen potential measuring method, and charged particle beam device
- Patent number 9,129,775
- Issue date Sep 8, 2015
- Hitachi High-Technologies Corporation
- Tatsuaki Ishijima
- G01 - MEASURING TESTING
Information Patent Grant
Sample electrification measurement method and charged particle beam...
- Patent number 8,835,844
- Issue date Sep 16, 2014
- Hitachi, Ltd.
- Makoto Ezumi
- G01 - MEASURING TESTING
Information Patent Grant
Electrostatic charge measurement method, focus adjustment method, a...
- Patent number 8,178,836
- Issue date May 15, 2012
- Hitachi High-Technologies Corporation
- Tatsuaki Ishijima
- G01 - MEASURING TESTING
Information Patent Grant
Electrostatic charge measurement method, focus adjustment method, a...
- Patent number 7,745,782
- Issue date Jun 29, 2010
- Hitachi High-Technologies Corporation
- Tatsuaki Ishijima
- G01 - MEASURING TESTING
Information Patent Grant
Sample electrification measurement method and charged particle beam...
- Patent number 7,700,918
- Issue date Apr 20, 2010
- Hitachi, Ltd.
- Makoto Ezumi
- G01 - MEASURING TESTING
Information Patent Grant
Sample electrification measurement method and charged particle beam...
- Patent number 7,372,028
- Issue date May 13, 2008
- Hitachi, Ltd.
- Makoto Ezumi
- G01 - MEASURING TESTING
Information Patent Grant
Sample electrification measurement method and charged particle beam...
- Patent number 7,087,899
- Issue date Aug 8, 2006
- Hitachi, Ltd.
- Makoto Ezumi
- G01 - MEASURING TESTING
Information Patent Grant
Sample electrification measurement method and charged particle beam...
- Patent number 6,946,656
- Issue date Sep 20, 2005
- Hitachi, Ltd.
- Makoto Ezumi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SPECIMEN POTENTIAL MEASURING METHOD, AND CHARGED PARTICLE BEAM DEVICE
- Publication number 20120119085
- Publication date May 17, 2012
- Hitachi High-Technologies Corporation
- Tatsuaki Ishijima
- G01 - MEASURING TESTING
Information Patent Application
Sample Electrification Measurement Method and Charged Particle Beam...
- Publication number 20100294929
- Publication date Nov 25, 2010
- Makoto Ezumi
- G01 - MEASURING TESTING
Information Patent Application
Electrostatic Charge Measurement Method, Focus Adjustment Method, a...
- Publication number 20100237241
- Publication date Sep 23, 2010
- Hitachi High-Technologies Corporation
- Tatsuaki ISHIJIMA
- G01 - MEASURING TESTING
Information Patent Application
Electrostatic Charge Measurement Method, Focus Adjustment Method, A...
- Publication number 20080203298
- Publication date Aug 28, 2008
- Hitachi High-Technologies Corporation
- Tatsuaki ISHIJIMA
- G01 - MEASURING TESTING
Information Patent Application
Sample electrification measurement method and charged particle beam...
- Publication number 20080201091
- Publication date Aug 21, 2008
- Makoto Ezumi
- G01 - MEASURING TESTING
Information Patent Application
Sample electrification measurement method and charged particle beam...
- Publication number 20060219918
- Publication date Oct 5, 2006
- Makoto Ezumi
- G01 - MEASURING TESTING
Information Patent Application
Sample electrification measurement method and charged particle beam...
- Publication number 20050161600
- Publication date Jul 28, 2005
- Makoto Ezumi
- G01 - MEASURING TESTING
Information Patent Application
Sample electrification measurement method and charged particle beam...
- Publication number 20040211899
- Publication date Oct 28, 2004
- Makoto Ezumi
- G01 - MEASURING TESTING

Tatsuaki ISHIJIMA

Person

Patents Grantslast 30 patents

Specimen potential measuring method, and charged particle beam device

Sample electrification measurement method and charged particle beam...

Electrostatic charge measurement method, focus adjustment method, a...

Electrostatic charge measurement method, focus adjustment method, a...

Sample electrification measurement method and charged particle beam...

Sample electrification measurement method and charged particle beam...

Sample electrification measurement method and charged particle beam...

Sample electrification measurement method and charged particle beam...

Patents Applicationslast 30 patents

SPECIMEN POTENTIAL MEASURING METHOD, AND CHARGED PARTICLE BEAM DEVICE

Sample Electrification Measurement Method and Charged Particle Beam...

Electrostatic Charge Measurement Method, Focus Adjustment Method, a...

Electrostatic Charge Measurement Method, Focus Adjustment Method, A...

Sample electrification measurement method and charged particle beam...

Sample electrification measurement method and charged particle beam...

Sample electrification measurement method and charged particle beam...

Sample electrification measurement method and charged particle beam...