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Tatsuhiro Watanabe
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Kawasaki, JP
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Patents Grants
last 30 patents
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Patent Grant
Semiconductor memory and burn-in test method of semiconductor memory
Patent number
7,200,059
Issue date
Apr 3, 2007
Fujitsu Limited
Shinya Fujioka
G11 - INFORMATION STORAGE
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Patent Grant
Semiconductor memory device having multilayer wiring structure
Patent number
5,258,639
Issue date
Nov 2, 1993
Fujitsu Limited
Tatsuhiro Watanabe
G11 - INFORMATION STORAGE
Patents Applications
last 30 patents
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Patent Application
Semiconductor memory and burn-in test method of semiconductor memory
Publication number
20060291307
Publication date
Dec 28, 2006
FUJITSU LIMITED
Shinya Fujioka
G11 - INFORMATION STORAGE