Tatsuichi Kato

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Hitachinaka, JP

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Patents Grantslast 30 patents

Information Patent Grant
Scanning electron microscope and sample observation method
- Patent number 8,519,334
- Issue date Aug 27, 2013
- Hitachi High-Technologies Corporation
- Satoshi Tadaka
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
SCANNING ELECTRON MICROSCOPE AND SAMPLE OBSERVATION METHOD
- Publication number 20130037716
- Publication date Feb 14, 2013
- Hitachi High-Technologies Corporation
- Satoshi Tadaka
- H01 - BASIC ELECTRIC ELEMENTS