Tatsuki NAKAYAMA

Person

Hiroshima, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Surface property measuring method and surface property measuring de...
- Patent number 11,193,749
- Issue date Dec 7, 2021
- Mitutoyo Corporation
- Tatsuki Nakayama
- G01 - MEASURING TESTING
Information Patent Grant
Surface property measuring device and control method for same
- Patent number 11,085,752
- Issue date Aug 10, 2021
- Mitutoyo Corporation
- Tatsuki Nakayama
- G01 - MEASURING TESTING
Information Patent Grant
Surface texture measuring apparatus
- Patent number 10,584,981
- Issue date Mar 10, 2020
- Mitutoyo Corporation
- Toshihiko Kajihara
- G01 - MEASURING TESTING
Information Patent Grant
Roundness measuring machine
- Patent number 10,514,244
- Issue date Dec 24, 2019
- Mitutoyo Corporation
- Tatsuki Nakayama
- G01 - MEASURING TESTING
Information Patent Grant
Roundness measuring apparatus
- Patent number 10,323,921
- Issue date Jun 18, 2019
- Mitutoyo Corporation
- Tatsuki Nakayama
- G01 - MEASURING TESTING
Information Patent Grant
Measuring probe and measuring probe system
- Patent number 10,001,358
- Issue date Jun 19, 2018
- Mitutoyo Corporation
- Kazuhiko Hidaka
- G01 - MEASURING TESTING
Information Patent Grant
Surface property measuring apparatus and method for controlling the...
- Patent number 9,921,044
- Issue date Mar 20, 2018
- Mitutoyo Corporation
- Tatsuki Nakayama
- G01 - MEASURING TESTING
Information Patent Grant
Roundness measurement device and control method
- Patent number 9,803,968
- Issue date Oct 31, 2017
- Mitutoyo Corporation
- Tatsuki Nakayama
- G01 - MEASURING TESTING
Information Patent Grant
Surface texture measuring apparatus
- Patent number 9,091,521
- Issue date Jul 28, 2015
- Mitutoyo Corporation
- Tatsuki Nakayama
- G01 - MEASURING TESTING
Information Patent Grant
Surface texture measuring apparatus
- Patent number 8,915,124
- Issue date Dec 23, 2014
- Mitutoyo Corporation
- Tatsuki Nakayama
- G01 - MEASURING TESTING
Information Patent Grant
Surface texture measuring instrument
- Patent number 8,701,301
- Issue date Apr 22, 2014
- Mitutoyo Corporation
- Tatsuki Nakayama
- G01 - MEASURING TESTING
Information Patent Grant
Roundness measuring apparatus
- Patent number 8,336,223
- Issue date Dec 25, 2012
- Mitutoyo Corporation
- Tatsuki Nakayama
- G01 - MEASURING TESTING
Information Patent Grant
Circularity measuring apparatus
- Patent number 8,020,309
- Issue date Sep 20, 2011
- Mitutoyo Corporation
- Tatsuki Nakayama
- G01 - MEASURING TESTING
Information Patent Grant
Surface texture measurement apparatus and roundness measuring appar...
- Patent number 7,950,164
- Issue date May 31, 2011
- Mitutoyo Corporation
- Tatsuki Nakayama
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
SURFACE PROPERTY MEASURING METHOD AND SURFACE PROPERTY MEASURING DE...
- Publication number 20200132429
- Publication date Apr 30, 2020
- MITUTOYO CORPORATION
- Tatsuki NAKAYAMA
- G01 - MEASURING TESTING
Information Patent Application
SURFACE PROPERTY MEASURING DEVICE AND CONTROL METHOD FOR SAME
- Publication number 20200132428
- Publication date Apr 30, 2020
- MITUTOYO CORPORATION
- Tatsuki NAKAYAMA
- G01 - MEASURING TESTING
Information Patent Application
SURFACE TEXTURE MEASURING APPARATUS
- Publication number 20180340798
- Publication date Nov 29, 2018
- Mitutoyo Corporation
- Toshihiko Kajihara
- G01 - MEASURING TESTING
Information Patent Application
ROUNDNESS MEASURING MACHINE
- Publication number 20180073852
- Publication date Mar 15, 2018
- MITUTOYO CORPORATION
- Tatsuki NAKAYAMA
- G01 - MEASURING TESTING
Information Patent Application
ROUNDNESS MEASURING APPARATUS
- Publication number 20180058836
- Publication date Mar 1, 2018
- MITUTOYO CORPORATION
- Tatsuki NAKAYAMA
- G01 - MEASURING TESTING
Information Patent Application
MEASURING PROBE AND MEASURING PROBE SYSTEM
- Publication number 20170097221
- Publication date Apr 6, 2017
- MITUTOYO CORPORATION
- Kazuhiko HIDAKA
- G01 - MEASURING TESTING
Information Patent Application
ROUNDNESS MEASUREMENT DEVICE AND CONTROL METHOD
- Publication number 20160084631
- Publication date Mar 24, 2016
- MITUTOYO CORPORATION
- Tatsuki NAKAYAMA
- G01 - MEASURING TESTING
Information Patent Application
SURFACE PROPERTY MEASURING APPARATUS AND METHOD FOR CONTROLLING THE...
- Publication number 20140326057
- Publication date Nov 6, 2014
- Mitutoyo Corporation
- Tatsuki Nakayama
- G01 - MEASURING TESTING
Information Patent Application
SURFACE TEXTURE MEASURING APPARATUS
- Publication number 20130133409
- Publication date May 30, 2013
- MITUTOYO CORPORATION
- Tatsuki NAKAYAMA
- G01 - MEASURING TESTING
Information Patent Application
SURFACE TEXTURE MEASURING INSTRUMENT
- Publication number 20120266475
- Publication date Oct 25, 2012
- MITUTOYO CORPORATION
- Tatsuki NAKAYAMA
- G01 - MEASURING TESTING
Information Patent Application
SURFACE TEXTURE MEASURING APPARATUS
- Publication number 20120227476
- Publication date Sep 13, 2012
- MITUTOYO CORPORATION
- Tatsuki NAKAYAMA
- G01 - MEASURING TESTING
Information Patent Application
SURFACE TEXTURE MEASUREMENT APPARATUS AND ROUNDNESS MEASURING APPAR...
- Publication number 20110005095
- Publication date Jan 13, 2011
- Mitutoyo Corporation
- Tatsuki Nakayama
- G01 - MEASURING TESTING
Information Patent Application
CIRCULARITY MEASURING APPARATUS
- Publication number 20100313436
- Publication date Dec 16, 2010
- Mitutoyo Corporation
- Tatsuki Nakayama
- G01 - MEASURING TESTING
Information Patent Application
ROUNDNESS MEASURING APPARATUS
- Publication number 20100293800
- Publication date Nov 25, 2010
- Mitutoyo Corporation
- Tatsuki Nakayama
- G01 - MEASURING TESTING

Tatsuki NAKAYAMA

Person

Patents Grantslast 30 patents

Surface property measuring method and surface property measuring de...

Surface property measuring device and control method for same

Surface texture measuring apparatus

Roundness measuring machine

Roundness measuring apparatus

Measuring probe and measuring probe system

Surface property measuring apparatus and method for controlling the...

Roundness measurement device and control method

Surface texture measuring apparatus

Surface texture measuring apparatus

Surface texture measuring instrument

Roundness measuring apparatus

Circularity measuring apparatus

Surface texture measurement apparatus and roundness measuring appar...

Patents Applicationslast 30 patents

SURFACE PROPERTY MEASURING METHOD AND SURFACE PROPERTY MEASURING DE...

SURFACE PROPERTY MEASURING DEVICE AND CONTROL METHOD FOR SAME

SURFACE TEXTURE MEASURING APPARATUS

ROUNDNESS MEASURING MACHINE

ROUNDNESS MEASURING APPARATUS

MEASURING PROBE AND MEASURING PROBE SYSTEM

ROUNDNESS MEASUREMENT DEVICE AND CONTROL METHOD

SURFACE PROPERTY MEASURING APPARATUS AND METHOD FOR CONTROLLING THE...

SURFACE TEXTURE MEASURING APPARATUS

SURFACE TEXTURE MEASURING INSTRUMENT

SURFACE TEXTURE MEASURING APPARATUS

SURFACE TEXTURE MEASUREMENT APPARATUS AND ROUNDNESS MEASURING APPAR...

CIRCULARITY MEASURING APPARATUS

ROUNDNESS MEASURING APPARATUS