Tatsumi Nakada

Person

Kawasaki, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device and method of testing semiconductor device
- Patent number 9,823,291
- Issue date Nov 21, 2017
- Fujitsu Limited
- Takahiro Shikibu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multicore processor test method
- Patent number 7,353,440
- Issue date Apr 1, 2008
- Fujitsu Limited
- Akihiko Ohwada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Cache control method and processor system
- Patent number 7,330,961
- Issue date Feb 12, 2008
- Fujitsu Limited
- Hideki Sakata
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Pipeline computer with a scoreboard control circuit to prevent inte...
- Patent number 6,055,625
- Issue date Apr 25, 2000
- Fujitsu Limited
- Tatsumi Nakada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System for detecting failure in information processing device
- Patent number 5,781,433
- Issue date Jul 14, 1998
- Fujitsu Limited
- Kenichi Nabeya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus and method for adjusting the skew of a timing signal usin...
- Patent number 5,745,533
- Issue date Apr 28, 1998
- Fujitsu Limited
- Yoshimi Asada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Apparatus for operand data bypassing having previous operand storag...
- Patent number 5,638,526
- Issue date Jun 10, 1997
- Fujitsu Limited
- Tatsumi Nakada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Data processor and method of controlling the same
- Patent number 5,634,136
- Issue date May 27, 1997
- Fujitsu Limited
- Toshiharu Ohshima
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Data processing apparatus
- Patent number 5,572,662
- Issue date Nov 5, 1996
- Fujitsu Limited
- Hidenobu Ohta
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE AND METHOD OF TESTING SEMICONDUCTOR DEVICE
- Publication number 20160043029
- Publication date Feb 11, 2016
- Fujitsu Limited
- Takahiro SHIKIBU
- G01 - MEASURING TESTING
Information Patent Application
Multicore processor test method
- Publication number 20050240850
- Publication date Oct 27, 2005
- Akihiko Ohwada
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Data processing device and method utilizing latency difference betw...
- Publication number 20050144409
- Publication date Jun 30, 2005
- FUJITSU LIMITED
- Akira Nodomi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Cache control method and processor system
- Publication number 20050102473
- Publication date May 12, 2005
- FUJITSU LIMITED
- Hideki Sakata
- G06 - COMPUTING CALCULATING COUNTING

Tatsumi Nakada

Person

Patents Grantslast 30 patents

Semiconductor device and method of testing semiconductor device

Multicore processor test method

Cache control method and processor system

Pipeline computer with a scoreboard control circuit to prevent inte...

System for detecting failure in information processing device

Apparatus and method for adjusting the skew of a timing signal usin...

Apparatus for operand data bypassing having previous operand storag...

Data processor and method of controlling the same

Data processing apparatus

Patents Applicationslast 30 patents

SEMICONDUCTOR DEVICE AND METHOD OF TESTING SEMICONDUCTOR DEVICE

Multicore processor test method

Data processing device and method utilizing latency difference betw...

Cache control method and processor system