Tatsuo HARIYAMA

Person

Fujisawa, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Distance measuring device, distance measuring method, and three-dim...
- Patent number 11,644,545
- Issue date May 9, 2023
- Hitachi, Ltd.
- Kenji Maruno
- G02 - OPTICS
Information Patent Grant
Shape measuring system and shape measuring method
- Patent number 11,635,295
- Issue date Apr 25, 2023
- Hitachi, Ltd.
- Tatsuo Hariyama
- G01 - MEASURING TESTING
Information Patent Grant
Shape measurement system, probe tip unit, and shape measurement method
- Patent number 11,421,976
- Issue date Aug 23, 2022
- Hitachi, Ltd.
- Tatsuo Hariyama
- G01 - MEASURING TESTING
Information Patent Grant
Shape measurement system, probe tip unit, and shape measurement method
- Patent number 11,054,242
- Issue date Jul 6, 2021
- Hitachi, Ltd.
- Tatsuo Hariyama
- G01 - MEASURING TESTING
Information Patent Grant
Distance measuring device and three-dimensional shape measuring app...
- Patent number 10,900,773
- Issue date Jan 26, 2021
- Hitachi, Ltd.
- Masahiro Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Three-dimensional shape measuring apparatus, three-dimensional shap...
- Patent number 10,436,572
- Issue date Oct 8, 2019
- Hitachi, Ltd.
- Masahiro Watanabe
- G01 - MEASURING TESTING
Information Patent Grant
Shape measuring method and device
- Patent number 9,733,066
- Issue date Aug 15, 2017
- Hitachi, Ltd.
- Hiroaki Kasai
- G01 - MEASURING TESTING
Information Patent Grant
Shape measuring method and device
- Patent number 9,541,380
- Issue date Jan 10, 2017
- Hitachi, Ltd.
- Hiroaki Kasai
- G01 - MEASURING TESTING
Information Patent Grant
Multi-point measuring apparatus and method of FBG sensor having mul...
- Patent number 9,062,965
- Issue date Jun 23, 2015
- Hitachi, Ltd.
- Minoru Yoshida
- G01 - MEASURING TESTING
Information Patent Grant
Distance measuring device and distance measuring method
- Patent number 8,982,332
- Issue date Mar 17, 2015
- Hitachi, Ltd.
- Takehiro Tachizaki
- G01 - MEASURING TESTING
Information Patent Grant
Disk surface inspection apparatus, inspection system thereof, and i...
- Patent number 8,253,935
- Issue date Aug 28, 2012
- Hitachi High-Technologies Corporation
- Tatsuo Hariyama
- G01 - MEASURING TESTING
Information Patent Grant
Surface defect inspecting apparatus with defect detection optical s...
- Patent number 8,018,585
- Issue date Sep 13, 2011
- Hitachi High-Technologies Corporation
- Tatsuo Hariyama
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for detecting defects on a disk surface
- Patent number 7,898,652
- Issue date Mar 1, 2011
- Hitachi High-Technologies Corporation
- Tatsuo Hariyama
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Distance Measurement System and Distance Measurement Method
- Publication number 20220268929
- Publication date Aug 25, 2022
- Hitachi, Ltd
- Tatsuo HARIYAMA
- G01 - MEASURING TESTING
Information Patent Application
Shape Measuring System and Shape Measuring Method
- Publication number 20220178680
- Publication date Jun 9, 2022
- Hitachi, Ltd
- Tatsuo HARIYAMA
- G01 - MEASURING TESTING
Information Patent Application
SHAPE MEASUREMENT SYSTEM, PROBE TIP UNIT, AND SHAPE MEASUREMENT METHOD
- Publication number 20210293524
- Publication date Sep 23, 2021
- Hitachi, Ltd
- Tatsuo HARIYAMA
- G01 - MEASURING TESTING
Information Patent Application
SHAPE MEASUREMENT SYSTEM, PROBE TIP UNIT, AND SHAPE MEASUREMENT METHOD
- Publication number 20200166327
- Publication date May 28, 2020
- Hitachi, Ltd
- Tatsuo HARIYAMA
- G01 - MEASURING TESTING
Information Patent Application
Distance Measuring Device and Three-Dimensional Shape Measuring App...
- Publication number 20200041259
- Publication date Feb 6, 2020
- Hitachi, Ltd
- Masahiro WATANABE
- G01 - MEASURING TESTING
Information Patent Application
DISTANCE MEASURING DEVICE, DISTANCE MEASURING METHOD, AND THREE-DIM...
- Publication number 20200018823
- Publication date Jan 16, 2020
- Hitachi, Ltd
- Kenji MARUNO
- G01 - MEASURING TESTING
Information Patent Application
Three-Dimensional Shape Measuring Apparatus, Three-Dimensional Shap...
- Publication number 20190011249
- Publication date Jan 10, 2019
- Masahiro WATANABE
- G01 - MEASURING TESTING
Information Patent Application
Distance Measuring Apparatus, Distance Measuring Method, and Shape...
- Publication number 20180224548
- Publication date Aug 9, 2018
- Hitachi ,Ltd.
- Tatsuo HARIYAMA
- G01 - MEASURING TESTING
Information Patent Application
Shape Measuring Method and Device
- Publication number 20160131473
- Publication date May 12, 2016
- Hitachi, Ltd
- Hiroaki Kasai
- G01 - MEASURING TESTING
Information Patent Application
SHAPE MEASURING METHOD AND DEVICE
- Publication number 20150241206
- Publication date Aug 27, 2015
- Hitachi, Ltd
- Hiroaki Kasai
- G01 - MEASURING TESTING
Information Patent Application
Multi-Point Measuring Method of FBG Sensor and Multi-Point Measurin...
- Publication number 20130140445
- Publication date Jun 6, 2013
- Hitachi, Ltd
- Minoru YOSHIDA
- G01 - MEASURING TESTING
Information Patent Application
Distance Measuring Device and Distance Measuring Method
- Publication number 20130003038
- Publication date Jan 3, 2013
- Hitachi, Ltd
- Takehiro Tachizaki
- G01 - MEASURING TESTING
Information Patent Application
DISK SURFACE INSPECTION APPARATUS, INSPECTION SYSTEM THEREOF, AND I...
- Publication number 20100201975
- Publication date Aug 12, 2010
- Tatsuo HARIYAMA
- G01 - MEASURING TESTING
Information Patent Application
SURFACE DEFECT INSPECTING APPARATUS WITH DEFECT DETECTION OPTICAL S...
- Publication number 20090237669
- Publication date Sep 24, 2009
- Tatsuo HARIYAMA
- G01 - MEASURING TESTING
Information Patent Application
METHOD AND APPARATUS FOR DETECTING DEFECTS ON A DISK SURFACE
- Publication number 20090190123
- Publication date Jul 30, 2009
- Tatsuo HARIYAMA
- G01 - MEASURING TESTING

Tatsuo HARIYAMA

Person

Patents Grantslast 30 patents

Distance measuring device, distance measuring method, and three-dim...

Shape measuring system and shape measuring method

Shape measurement system, probe tip unit, and shape measurement method

Shape measurement system, probe tip unit, and shape measurement method

Distance measuring device and three-dimensional shape measuring app...

Three-dimensional shape measuring apparatus, three-dimensional shap...

Shape measuring method and device

Shape measuring method and device

Multi-point measuring apparatus and method of FBG sensor having mul...

Distance measuring device and distance measuring method

Disk surface inspection apparatus, inspection system thereof, and i...

Surface defect inspecting apparatus with defect detection optical s...

Method and apparatus for detecting defects on a disk surface

Patents Applicationslast 30 patents

Distance Measurement System and Distance Measurement Method

Shape Measuring System and Shape Measuring Method

SHAPE MEASUREMENT SYSTEM, PROBE TIP UNIT, AND SHAPE MEASUREMENT METHOD

SHAPE MEASUREMENT SYSTEM, PROBE TIP UNIT, AND SHAPE MEASUREMENT METHOD

Distance Measuring Device and Three-Dimensional Shape Measuring App...

DISTANCE MEASURING DEVICE, DISTANCE MEASURING METHOD, AND THREE-DIM...

Three-Dimensional Shape Measuring Apparatus, Three-Dimensional Shap...

Distance Measuring Apparatus, Distance Measuring Method, and Shape...

Shape Measuring Method and Device

SHAPE MEASURING METHOD AND DEVICE

Multi-Point Measuring Method of FBG Sensor and Multi-Point Measurin...

Distance Measuring Device and Distance Measuring Method

DISK SURFACE INSPECTION APPARATUS, INSPECTION SYSTEM THEREOF, AND I...

SURFACE DEFECT INSPECTING APPARATUS WITH DEFECT DETECTION OPTICAL S...

METHOD AND APPARATUS FOR DETECTING DEFECTS ON A DISK SURFACE