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Tatsuo Igushi
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Miyanonigashi-machi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Centrifugal sedimentation type particle size distribution measuring...
Patent number
11,428,616
Issue date
Aug 30, 2022
Horiba, Ltd.
Tetsuji Yamaguchi
G01 - MEASURING TESTING
Information
Patent Grant
Particle analysis apparatus
Patent number
10,254,213
Issue date
Apr 9, 2019
HORIBA, LTD.
Motoaki Hamada
G01 - MEASURING TESTING
Information
Patent Grant
Particle characterization device
Patent number
8,625,093
Issue date
Jan 7, 2014
Horiba, Ltd.
Tetsuji Yamaguchi
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method of cataloging test data by icons
Patent number
7,483,027
Issue date
Jan 27, 2009
Horiba, Ltd.
Seiichiro Yoshioka
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Particle size distribution measuring apparatus
Patent number
6,252,658
Issue date
Jun 26, 2001
Horiba, Ltd.
Yoshiaki Togawa
G01 - MEASURING TESTING
Information
Patent Grant
Particle size distribution measuring apparatus, including an array...
Patent number
6,236,458
Issue date
May 22, 2001
Horiba, Ltd.
Tatsuo Igushi
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for measuring particle size distribution and method for a...
Patent number
6,191,853
Issue date
Feb 20, 2001
Horiba, Ltd.
Tetsuji Yamaguchi
G01 - MEASURING TESTING
Information
Patent Grant
Optical axis adjustment apparatus and method for particle size dist...
Patent number
6,061,131
Issue date
May 9, 2000
Horiba, Ltd.
Tatsuo Igushi
G01 - MEASURING TESTING
Information
Patent Grant
Photo detector assembly for measuring particle sizes
Patent number
5,936,729
Issue date
Aug 10, 1999
Horiba, Ltd.
Tatsuo Igushi
G01 - MEASURING TESTING
Information
Patent Grant
Particle size distribution analyzer with fractionator pretreatment
Patent number
5,796,480
Issue date
Aug 18, 1998
Horiba, Ltd.
Tatsuo Igushi
G01 - MEASURING TESTING
Information
Patent Grant
Dry particle-size distribution measuring apparatus
Patent number
5,682,235
Issue date
Oct 28, 1997
Horiba, Ltd.
Tatsuo Igushi
G01 - MEASURING TESTING
Information
Patent Grant
Sample cell for diffraction-scattering measurement of particle size...
Patent number
5,212,393
Issue date
May 18, 1993
Horiba, Ltd.
Yoshiaki Togawa
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for simultaneously measuring large and small particle siz...
Patent number
5,185,641
Issue date
Feb 9, 1993
Horiba, Ltd.
Tatsuo Igushi
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus for measuring particle size distribution
Patent number
5,164,787
Issue date
Nov 17, 1992
Horiba, Ltd.
Tatsuo Igushi
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
CENTRIFUGAL SEDIMENTATION TYPE PARTICLE SIZE DISTRIBUTION MEASURING...
Publication number
20210310925
Publication date
Oct 7, 2021
HORIBA, LTD.
Tetsuji YAMAGUCHI
G01 - MEASURING TESTING
Information
Patent Application
PARTICLE ANALYSIS APPARATUS
Publication number
20160018314
Publication date
Jan 21, 2016
HORIBA, Ltd.
Motoaki Hamada
G01 - MEASURING TESTING
Information
Patent Application
PARTICLE CHARACTERIZATION DEVICE
Publication number
20110181869
Publication date
Jul 28, 2011
Horiba, Ltd.
Tetsuji Yamaguchi
G01 - MEASURING TESTING
Information
Patent Application
Apparatus and method of cataloging test data by icons
Publication number
20060055697
Publication date
Mar 16, 2006
Seiichiro Yoshioka
G06 - COMPUTING CALCULATING COUNTING