Tatsuo Ishigaki

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Probe card and inspection apparatus
- Patent number 8,736,292
- Issue date May 27, 2014
- Kabushiki Kaisha Nihon Micronics
- Tatsuo Ishigaki
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBE CARD AND INSPECTION APPARATUS
- Publication number 20100327898
- Publication date Dec 30, 2010
- Kabushiki Kaisha Nihon Micronics
- Tatsuo Ishigaki
- G01 - MEASURING TESTING