Tatsuru Kuramoto

Follow

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Image evaluation method and charged particle beam device
- Patent number 9,396,905
- Issue date Jul 19, 2016
- Jeol Ltd.
- Tatsuru Kuramoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Scanning electron microscope
- Patent number 8,957,372
- Issue date Feb 17, 2015
- Jeol Ltd.
- Tatsuru Kuramoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron detecting mechanism and charged particle beam system equip...
- Patent number 8,466,416
- Issue date Jun 18, 2013
- Jeol Ltd.
- Tatsuru Kuramoto
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Image Evaluation Method and Charged Particle Beam Device
- Publication number 20160133434
- Publication date May 12, 2016
- JEOL Ltd.
- Tatsuru Kuramoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Scanning Electron Microscope
- Publication number 20140084158
- Publication date Mar 27, 2014
- JEOL Ltd.
- Tatsuru Kuramoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Electron Detecting Mechanism and Charged Particle Beam System Equip...
- Publication number 20120241609
- Publication date Sep 27, 2012
- JEOL Ltd.
- Tatsuru Kuramoto
- H01 - BASIC ELECTRIC ELEMENTS