Tatsuru MATSUO

Follow

Person

Yokohama, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Semiconductor device and semiconductor device test method for ident...
- Patent number 8,325,548
- Issue date Dec 4, 2012
- Fujitsu Semiconductor Limited
- Tatsuru Matsuo
- G11 - INFORMATION STORAGE
Information Patent Grant
Electric fuse cutoff control circuit renewing cutoff information an...
- Patent number 8,278,990
- Issue date Oct 2, 2012
- Fujitsu Semiconductor Limited
- Tatsuru Matsuo
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
SEMICONDUCTOR DEVICE AND SEMICONDUCTOR DEVICE TEST METHOD
- Publication number 20100322023
- Publication date Dec 23, 2010
- FUJITSU SEMICONDUCTOR LIMITED
- Tatsuru MATSUO
- G11 - INFORMATION STORAGE
Information Patent Application
ELECTRIC FUSE CUTOFF CONTROL CIRCUIT AND SEMICONDUCTOR DEVICE
- Publication number 20100244933
- Publication date Sep 30, 2010
- FUJITSU MICROELECTRONICS LIMITED
- Tatsuru MATSUO
- G11 - INFORMATION STORAGE