Tatsuya Adachi

Person

Chiba, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Stage for working, focused beam working apparatus and focused beam...
- Patent number 8,598,485
- Issue date Dec 3, 2013
- Sii Nano Technology Inc.
- Tatsuya Adachi
- G01 - MEASURING TESTING
Information Patent Grant
Micro cross-section processing method
- Patent number 8,304,721
- Issue date Nov 6, 2012
- SII NanoTechnology Inc.
- Kouji Iwasaki
- G01 - MEASURING TESTING
Information Patent Grant
TEM sample equipped with an identifying function, focused ion beam...
- Patent number 7,095,024
- Issue date Aug 22, 2006
- SII NanoTechnology Inc.
- Tatsuya Adachi
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for processing and observing a sample
- Patent number 6,870,161
- Issue date Mar 22, 2005
- SII NanoTechnology Inc.
- Tatsuya Adachi
- G01 - MEASURING TESTING
Information Patent Grant
Probe for scanning probe microscope
- Patent number 6,864,481
- Issue date Mar 8, 2005
- SII NanoTechnology Inc.
- Takashi Kaito
- G01 - MEASURING TESTING
Information Patent Grant
Micromachining method for workpiece observation
- Patent number 6,395,347
- Issue date May 28, 2002
- Seiko Instruments Inc.
- Tatsuya Adachi
- G01 - MEASURING TESTING
Information Patent Grant
Focused ion beam apparatus and method
- Patent number 5,574,280
- Issue date Nov 12, 1996
- Seiko Instruments Inc.
- Toshiaki Fujii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Focused charged beam apparatus, and its processing and observation...
- Patent number 5,525,806
- Issue date Jun 11, 1996
- Seiko Instruments Inc.
- Koji Iwasaki
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for forming, correcting pattern
- Patent number 5,086,230
- Issue date Feb 4, 1992
- Seiko Instruments & Electronics Ltd.
- Tatsuya Adachi
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Grant
Preparation and observation method of micro-section
- Patent number 5,028,780
- Issue date Jul 2, 1991
- Seiko Instruments, Inc.
- Takashi Kaito
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for preparation and observation of a topographic section
- Patent number 5,023,453
- Issue date Jun 11, 1991
- Seiko Instruments, Inc.
- Tatsuya Adachi
- G01 - MEASURING TESTING
Information Patent Grant
Process for forming metallic patterned film
- Patent number 4,876,112
- Issue date Oct 24, 1989
- Seiko Instruments Inc.
- Takashi Kaito
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...

Patents Applicationslast 30 patents

Information Patent Application
MICRO CROSS-SECTION PROCESSING METHOD
- Publication number 20100215868
- Publication date Aug 26, 2010
- Kouji Iwasaki
- G01 - MEASURING TESTING
Information Patent Application
Stage for Working, Focused Beam Working Apparatus and Focused Beam...
- Publication number 20080029492
- Publication date Feb 7, 2008
- SII NANO TECHNOLOGY INC.
- Tatsuya Adachi
- G01 - MEASURING TESTING
Information Patent Application
Processing probe, processing apparatus, and method of manufacturing...
- Publication number 20060192114
- Publication date Aug 31, 2006
- Tatsuya Adachi
- G01 - MEASURING TESTING
Information Patent Application
TEM sample equipped with an identifying function, focused ion beam...
- Publication number 20040227082
- Publication date Nov 18, 2004
- Tatsuya Adachi
- B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information Patent Application
Sample manufacturing apparatus
- Publication number 20040129897
- Publication date Jul 8, 2004
- Tatsuya Adachi
- G01 - MEASURING TESTING
Information Patent Application
Focused ion beam system and machining method using it
- Publication number 20030173527
- Publication date Sep 18, 2003
- Tatsuya Adachi
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Probe for scanning probe microscope
- Publication number 20030122072
- Publication date Jul 3, 2003
- Takashi Kaito
- G01 - MEASURING TESTING

Tatsuya Adachi

Person

Patents Grantslast 30 patents

Stage for working, focused beam working apparatus and focused beam...

Micro cross-section processing method

TEM sample equipped with an identifying function, focused ion beam...

Apparatus for processing and observing a sample

Probe for scanning probe microscope

Micromachining method for workpiece observation

Focused ion beam apparatus and method

Focused charged beam apparatus, and its processing and observation...

Apparatus for forming, correcting pattern

Preparation and observation method of micro-section

Apparatus for preparation and observation of a topographic section

Process for forming metallic patterned film

Patents Applicationslast 30 patents

MICRO CROSS-SECTION PROCESSING METHOD

Stage for Working, Focused Beam Working Apparatus and Focused Beam...

Processing probe, processing apparatus, and method of manufacturing...

TEM sample equipped with an identifying function, focused ion beam...

Sample manufacturing apparatus

Focused ion beam system and machining method using it

Probe for scanning probe microscope