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Tatsuya Aota
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Hyogo, JP
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last 30 patents
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Patent Grant
Apparatus and a method for inspection of a mask blank, a method for...
Patent number
7,911,600
Issue date
Mar 22, 2011
Renesas Electronics Corporation
Tsuneo Terasawa
G01 - MEASURING TESTING
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last 30 patents
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Patent Application
APPARATUS AND A METHOD FOR INSPECTION OF A MASK BLANK, A METHOD FOR...
Publication number
20090091752
Publication date
Apr 9, 2009
RENESAS TECHNOLOGY CORP.
Tsuneo TERASAWA
G01 - MEASURING TESTING