Tatsuya Asahata

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Automatic sample preparation apparatus
- Patent number 11,835,438
- Issue date Dec 5, 2023
- Hitachi High-Tech Science Corporation
- Atsushi Uemoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Liquid metal ion source and focused ion beam apparatus
- Patent number 11,749,493
- Issue date Sep 5, 2023
- Hitachi High-Tech Science Corporation
- Yoshihiro Koyama
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus and control method thereof
- Patent number 11,742,177
- Issue date Aug 29, 2023
- Hitachi High-Tech Science Corporation
- Ayana Muraki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Focused ion beam apparatus
- Patent number 11,482,398
- Issue date Oct 25, 2022
- Hitachi High-Tech Science Corporation
- Haruyuki Ishii
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam irradiation apparatus and control method
- Patent number 11,424,100
- Issue date Aug 23, 2022
- Hitachi High-Tech Science Corporation
- Takuma Aso
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 11,361,936
- Issue date Jun 14, 2022
- Hitachi High-Tech Science Corporation
- Ayana Muraki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Particle beam irradiation apparatus
- Patent number 11,335,534
- Issue date May 17, 2022
- Hitachi High-Tech Science Corporation
- Takuma Aso
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus and sample processing observation m...
- Patent number 11,282,672
- Issue date Mar 22, 2022
- Hitachi High-Tech Science Corporation
- Hidekazu Suzuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 11,239,046
- Issue date Feb 1, 2022
- Hitachi High-Tech Science Corporation
- Ayana Muraki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus and control method thereof
- Patent number 11,177,113
- Issue date Nov 16, 2021
- Hitachi High-Tech Science Corporation
- Ayana Muraki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Apparatus, method, and program for processing and observing cross s...
- Patent number 11,114,276
- Issue date Sep 7, 2021
- Hitachi High-Tech Science Corporation
- Xin Man
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automatic sample preparation apparatus and automatic sample prepara...
- Patent number 11,073,453
- Issue date Jul 27, 2021
- Hitachi High-Tech Science Corporation
- Atsushi Uemoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam device
- Patent number 10,832,890
- Issue date Nov 10, 2020
- Hitachi High-Tech Science Corporation
- Masato Suzuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automatic sample preparation apparatus
- Patent number 10,677,697
- Issue date Jun 9, 2020
- Hitachi High-Tech Science Corporation
- Atsushi Uemoto
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam apparatus
- Patent number 10,658,147
- Issue date May 19, 2020
- Hitachi High-Tech Science Corporation
- Makoto Sato
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Composite beam apparatus
- Patent number 10,636,615
- Issue date Apr 28, 2020
- Hitachi High-Tech Science Corporation
- Tatsuya Asahata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 10,629,411
- Issue date Apr 21, 2020
- Hitachi High-Tech Science Corporation
- Satoshi Tomimatsu
- G01 - MEASURING TESTING
Information Patent Grant
Charged particle beam apparatus and sample processing observation m...
- Patent number 10,622,187
- Issue date Apr 14, 2020
- Hitachi High-Tech Science Corporation
- Yo Yamamoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Portable information terminal, beam irradiation system, and program
- Patent number 10,485,087
- Issue date Nov 19, 2019
- Hitachi High-Tech Science Corporation
- Takuma Aso
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Charged particle beam apparatus
- Patent number 10,236,159
- Issue date Mar 19, 2019
- Hitachi High-Tech Science Corporation
- Satoshi Tomimatsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Composite beam apparatus
- Patent number 10,204,759
- Issue date Feb 12, 2019
- Hitachi High-Tech Science Corporation
- Tatsuya Asahata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cross-section processing-and-observation method and cross-section p...
- Patent number 10,096,449
- Issue date Oct 9, 2018
- Hitachi High-Tech Science Corporation
- Xin Man
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automatic sample preparation apparatus
- Patent number 10,088,401
- Issue date Oct 2, 2018
- Hitachi High-Tech Science Corporation
- Atsushi Uemoto
- G01 - MEASURING TESTING
Information Patent Grant
Microsample stage and method of manufacturing the same
- Patent number 10,014,155
- Issue date Jul 3, 2018
- Hitachi High-Tech Science Corporation
- Tatsuya Asahata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cross-section processing and observation method and cross-section p...
- Patent number 9,966,226
- Issue date May 8, 2018
- Hitachi High-Tech Science Corporation
- Atsushi Uemoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Focused ion beam apparatus, method for observing cross-section of s...
- Patent number 9,934,938
- Issue date Apr 3, 2018
- Hitachi High-Tech Science Corporation
- Atsushi Uemoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 9,741,535
- Issue date Aug 22, 2017
- Hitachi High-Tech Science Corporation
- Shota Torikawa
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 9,620,333
- Issue date Apr 11, 2017
- Hitachi High-Tech Science Corporation
- Satoshi Tomimatsu
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Cross section processing method and cross section processing apparatus
- Patent number 9,548,185
- Issue date Jan 17, 2017
- Hitachi High-Tech Science Corporation
- Hidekazu Suzuki
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Charged particle beam apparatus
- Patent number 9,455,119
- Issue date Sep 27, 2016
- Hitachi High-Tech Science Corporation
- Makoto Sato
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
CONTROL METHOD, CHARGED PARTICLE BEAM DEVICE, AND PROGRAM
- Publication number 20240379323
- Publication date Nov 14, 2024
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Toshiyuki NAGAMINE
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SAMPLE PIECE RELOCATING DEVICE
- Publication number 20240087841
- Publication date Mar 14, 2024
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Tatsuya ASAHATA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS AND CONTROL METHOD THEREOF
- Publication number 20220084785
- Publication date Mar 17, 2022
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Ayana MURAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTOMATIC SAMPLE PREPARATION APPARATUS
- Publication number 20210341362
- Publication date Nov 4, 2021
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Atsushi Uemoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR OBSERVING BIOLOGICAL TISSUE SAMPLE
- Publication number 20210293668
- Publication date Sep 23, 2021
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Xin MAN
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20210090850
- Publication date Mar 25, 2021
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Ayana MURAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
LIQUID METAL ION SOURCE AND FOCUSED ION BEAM APPARATUS
- Publication number 20210090842
- Publication date Mar 25, 2021
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Yoshihiro KOYAMA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
FOCUSED ION BEAM APPARATUS
- Publication number 20210090849
- Publication date Mar 25, 2021
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Haruyuki ISHII
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20210090851
- Publication date Mar 25, 2021
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Ayana MURAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PARTICLE BEAM IRRADIATION APPARATUS
- Publication number 20210090853
- Publication date Mar 25, 2021
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Takuma ASO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM IRRADIATION APPARATUS AND CONTROL METHOD
- Publication number 20210090855
- Publication date Mar 25, 2021
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Takuma ASO
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC SAMPLE PREPARATION APPARATUS AND AUTOMATIC SAMPLE PREPARA...
- Publication number 20200355589
- Publication date Nov 12, 2020
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Atsushi Uemoto
- G01 - MEASURING TESTING
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS AND CONTROL METHOD THEREOF
- Publication number 20200312617
- Publication date Oct 1, 2020
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Ayana MURAKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTOMATIC SAMPLE PREPARATION APPARATUS
- Publication number 20200278281
- Publication date Sep 3, 2020
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Atsushi Uemoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS AND SAMPLE PROCESSING OBSERVATION M...
- Publication number 20200126755
- Publication date Apr 23, 2020
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Hidekazu SUZUKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM DEVICE
- Publication number 20190304745
- Publication date Oct 3, 2019
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Masato SUZUKI
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
APPARATUS, METHOD, AND PROGRAM FOR PROCESSING AND OBSERVING CROSS S...
- Publication number 20190279843
- Publication date Sep 12, 2019
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Xin MAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS AND SAMPLE PROCESSING OBSERVATION M...
- Publication number 20190259574
- Publication date Aug 22, 2019
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Yo YAMAMOTO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
COMPOSITE BEAM APPARATUS
- Publication number 20190189388
- Publication date Jun 20, 2019
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Tatsuya ASAHATA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20190157037
- Publication date May 23, 2019
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Satoshi TOMIMATSU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTOMATIC SAMPLE PREPARATION APPARATUS
- Publication number 20190025167
- Publication date Jan 24, 2019
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Atsushi Uemoto
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PORTABLE INFORMATION TERMINAL, BEAM IRRADIATION SYSTEM, AND PROGRAM
- Publication number 20180288865
- Publication date Oct 4, 2018
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Takuma ASO
- H05 - ELECTRIC TECHNIQUES NOT OTHERWISE PROVIDED FOR
Information Patent Application
COMPOSITE BEAM APPARATUS
- Publication number 20180076001
- Publication date Mar 15, 2018
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Tatsuya ASAHATA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20170278664
- Publication date Sep 28, 2017
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Makoto SATO
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20170178858
- Publication date Jun 22, 2017
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Satoshi TOMIMATSU
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
AUTOMATIC SAMPLE PREPARATION APPARATUS
- Publication number 20170122852
- Publication date May 4, 2017
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Atsushi Uemoto
- G01 - MEASURING TESTING
Information Patent Application
MICROSAMPLE STAGE AND METHOD OF MANUFACTURING THE SAME
- Publication number 20160372301
- Publication date Dec 22, 2016
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Tatsuya ASAHATA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CROSS-SECTION PROCESSING-AND-OBSERVATION METHOD AND CROSS-SECTION P...
- Publication number 20160343541
- Publication date Nov 24, 2016
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Xin MAN
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20160093467
- Publication date Mar 31, 2016
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Shota TORIKAWA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CHARGED PARTICLE BEAM APPARATUS
- Publication number 20160064187
- Publication date Mar 3, 2016
- HITACHI HIGH-TECH SCIENCE CORPORATION
- Satoshi TOMIMATSU
- H01 - BASIC ELECTRIC ELEMENTS

Tatsuya Asahata

Person

Patents Grantslast 30 patents

Automatic sample preparation apparatus

Liquid metal ion source and focused ion beam apparatus

Charged particle beam apparatus and control method thereof

Focused ion beam apparatus

Charged particle beam irradiation apparatus and control method

Charged particle beam apparatus

Particle beam irradiation apparatus

Charged particle beam apparatus and sample processing observation m...

Charged particle beam apparatus

Charged particle beam apparatus and control method thereof

Apparatus, method, and program for processing and observing cross s...

Automatic sample preparation apparatus and automatic sample prepara...

Charged particle beam device

Automatic sample preparation apparatus

Charged particle beam apparatus

Composite beam apparatus

Charged particle beam apparatus

Charged particle beam apparatus and sample processing observation m...

Portable information terminal, beam irradiation system, and program

Charged particle beam apparatus

Composite beam apparatus

Cross-section processing-and-observation method and cross-section p...

Automatic sample preparation apparatus

Microsample stage and method of manufacturing the same

Cross-section processing and observation method and cross-section p...

Focused ion beam apparatus, method for observing cross-section of s...

Charged particle beam apparatus

Charged particle beam apparatus

Cross section processing method and cross section processing apparatus

Charged particle beam apparatus

Patents Applicationslast 30 patents

CONTROL METHOD, CHARGED PARTICLE BEAM DEVICE, AND PROGRAM

SAMPLE PIECE RELOCATING DEVICE

CHARGED PARTICLE BEAM APPARATUS AND CONTROL METHOD THEREOF

AUTOMATIC SAMPLE PREPARATION APPARATUS

METHOD FOR OBSERVING BIOLOGICAL TISSUE SAMPLE

CHARGED PARTICLE BEAM APPARATUS

LIQUID METAL ION SOURCE AND FOCUSED ION BEAM APPARATUS

FOCUSED ION BEAM APPARATUS

CHARGED PARTICLE BEAM APPARATUS

PARTICLE BEAM IRRADIATION APPARATUS

CHARGED PARTICLE BEAM IRRADIATION APPARATUS AND CONTROL METHOD

AUTOMATIC SAMPLE PREPARATION APPARATUS AND AUTOMATIC SAMPLE PREPARA...

CHARGED PARTICLE BEAM APPARATUS AND CONTROL METHOD THEREOF

AUTOMATIC SAMPLE PREPARATION APPARATUS

CHARGED PARTICLE BEAM APPARATUS AND SAMPLE PROCESSING OBSERVATION M...

CHARGED PARTICLE BEAM DEVICE

APPARATUS, METHOD, AND PROGRAM FOR PROCESSING AND OBSERVING CROSS S...

CHARGED PARTICLE BEAM APPARATUS AND SAMPLE PROCESSING OBSERVATION M...

COMPOSITE BEAM APPARATUS

CHARGED PARTICLE BEAM APPARATUS

AUTOMATIC SAMPLE PREPARATION APPARATUS

PORTABLE INFORMATION TERMINAL, BEAM IRRADIATION SYSTEM, AND PROGRAM

COMPOSITE BEAM APPARATUS

CHARGED PARTICLE BEAM APPARATUS

CHARGED PARTICLE BEAM APPARATUS

AUTOMATIC SAMPLE PREPARATION APPARATUS

MICROSAMPLE STAGE AND METHOD OF MANUFACTURING THE SAME

CROSS-SECTION PROCESSING-AND-OBSERVATION METHOD AND CROSS-SECTION P...

CHARGED PARTICLE BEAM APPARATUS

CHARGED PARTICLE BEAM APPARATUS