Tatsuya Ichinose

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Tokyo, JP

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Patents Grantslast 30 patents

Information Patent Grant
Method for analyzing metal fine particles, and inductively coupled...
- Patent number 11,569,081
- Issue date Jan 31, 2023
- IAS Inc.
- Katsuhiko Kawabata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Automatic localized substrate analysis device and analysis method
- Patent number 10,151,727
- Issue date Dec 11, 2018
- IAS, INC
- Katsuhiko Kawabata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Analysis system for online-transferred analysis sample
- Patent number 10,024,801
- Issue date Jul 17, 2018
- IAS Inc.
- Katsuhiko Kawabata
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR ANALYZING METAL MICROPARTICLES, AND INDUCTIVELY COUPLED...
- Publication number 20230335387
- Publication date Oct 19, 2023
- IAS Inc.
- Katsuhiko Kawabata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR ANALYZING METAL MICROPARTICLES, AND INDUCTIVELY COUPLED...
- Publication number 20210148858
- Publication date May 20, 2021
- IAS Inc.
- Katsuhiko KKAWABATA
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
NOZZLE FOR SUBSTRATE ANALYSIS
- Publication number 20190013248
- Publication date Jan 10, 2019
- IAS Inc.
- Katsuhiko Kawabata
- G01 - MEASURING TESTING
Information Patent Application
SILICON SUBSTRATE ANALYZING DEVICE
- Publication number 20180217036
- Publication date Aug 2, 2018
- IAS Inc.
- Katsuhiko Kawabata
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
SYSTEM FOR ANALYZING ONLINE-TRANSFERRED ASSAY SAMPLES
- Publication number 20180024068
- Publication date Jan 25, 2018
- IAS Inc.
- Katsuhiko Kawabata
- G01 - MEASURING TESTING
Information Patent Application
AUTOMATIC LOCALIZED SUBSTRATE ANALYSIS DEVICE AND ANALYSIS METHOD
- Publication number 20170160233
- Publication date Jun 8, 2017
- IAS Inc.
- Katsuhiko Kawabata
- G01 - MEASURING TESTING