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SEMICONDUCTOR DEVICE
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Publication number 20120217605
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Publication date Aug 30, 2012
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Renesas Electronics Corporation
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Tatsuya KUNIKIYO
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H01 - BASIC ELECTRIC ELEMENTS
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Semiconductor device
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Publication number 20050007120
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Publication date Jan 13, 2005
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MATSUSHITA ELECTRIC INDUSTRIAL CO., LTD.
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Kyoji Yamashita
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G01 - MEASURING TESTING
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Semiconductor device
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Publication number 20040222528
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Publication date Nov 11, 2004
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Mitsubishi Denki Kabushiki Kaisha
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Tatsuya Kunikiyo
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H01 - BASIC ELECTRIC ELEMENTS
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Capacitance measurement circuit
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Publication number 20040207412
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Publication date Oct 21, 2004
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Renesas Technology Corp.
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Tatsuya Kunikiyo
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G01 - MEASURING TESTING
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Inductance measuring method
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Publication number 20040080330
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Publication date Apr 29, 2004
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Mitsubishi Denki Kabushiki Kaisha
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Tatsuya Kunikiyo
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G01 - MEASURING TESTING
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Capacitance measurement method
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Publication number 20030227291
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Publication date Dec 11, 2003
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Mitsubishi Denki Kabushiki Kaisha
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Takeshi Okagaki
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G01 - MEASURING TESTING
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Magnetic memory device
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Publication number 20030223283
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Publication date Dec 4, 2003
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Mitsubishi Denki Kabushiki Kaisha
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Tatsuya Kunikiyo
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G11 - INFORMATION STORAGE
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Semiconductor memory device
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Publication number 20030198096
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Publication date Oct 23, 2003
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Mitsubishi Denki Kabushiki Kaisha
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Tatsuya Kunikiyo
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H03 - BASIC ELECTRONIC CIRCUITRY
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Semiconductor device
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Publication number 20020175375
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Publication date Nov 28, 2002
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Mitsubishi Denki Kabushiki Kaisha
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Tatsuya Kunikiyo
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H01 - BASIC ELECTRIC ELEMENTS
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Non-volatile semiconductor memory
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Publication number 20020149958
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Publication date Oct 17, 2002
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Mitsubishi Denki Kabushiki Kaisha
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Tatsuya Kunikiyo
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H01 - BASIC ELECTRIC ELEMENTS
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