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Tatsuya Miyatani
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Tokyo, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Replacement blade supplying mechanism
Patent number
10,488,303
Issue date
Nov 26, 2019
Sakura Finetek Japan Co., Ltd
Tatsuya Miyatani
B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information
Patent Grant
Thin-slice manufacturing device and thin-slice manufacturing method
Patent number
10,018,535
Issue date
Jul 10, 2018
Sakura Finetek Japan Co., Ltd
Tatsuya Miyatani
G01 - MEASURING TESTING
Information
Patent Grant
Thin section preparation device
Patent number
9,983,100
Issue date
May 29, 2018
Sakura Finetek Japan Co., Ltd
Tatsuya Miyatani
G01 - MEASURING TESTING
Information
Patent Grant
Automatic thin section sample preparation device
Patent number
9,291,532
Issue date
Mar 22, 2016
Sakura Finetek Japan Co., Ltd
Tatsuya Miyatani
G01 - MEASURING TESTING
Information
Patent Grant
Thin-section manufacturing apparatus
Patent number
8,245,613
Issue date
Aug 21, 2012
Sakura Finetek Japan Co., Ltd
Tatsuya Miyatani
G01 - MEASURING TESTING
Information
Patent Grant
Automatic thin-section manufacturing system
Patent number
8,156,853
Issue date
Apr 17, 2012
Seiko Instruments, Inc.
Hirohito Fujiwara
G01 - MEASURING TESTING
Information
Patent Grant
Sectioning instrument
Patent number
8,087,334
Issue date
Jan 3, 2012
Seiko Instruments Inc.
Tatsuya Miyatani
G01 - MEASURING TESTING
Information
Patent Grant
Automatic slicing apparatus
Patent number
8,074,547
Issue date
Dec 13, 2011
Seiko Instruments Inc.
Tetsumasa Ito
G01 - MEASURING TESTING
Information
Patent Grant
Automatic thin-section slides manufacturing system and method
Patent number
7,966,091
Issue date
Jun 21, 2011
Seiko Instruments Inc.
Koji Fujimoto
G01 - MEASURING TESTING
Information
Patent Grant
Thin-section conveyor apparatus, thin-section scooping tool, and me...
Patent number
7,866,464
Issue date
Jan 11, 2011
Seiko Instruments Inc.
Tatsuya Miyatani
G01 - MEASURING TESTING
Information
Patent Grant
Automatic sliced piece fabricating apparatus and automatic sliced p...
Patent number
7,802,507
Issue date
Sep 28, 2010
Seiko Instruments Inc.
Tetsumasa Ito
G01 - MEASURING TESTING
Information
Patent Grant
Container for processing section samples, processing method for sec...
Patent number
7,616,302
Issue date
Nov 10, 2009
Seiko Instruments, Inc.
Tatsuya Miyatani
G01 - MEASURING TESTING
Information
Patent Grant
Scanning probe microscope
Patent number
6,740,876
Issue date
May 25, 2004
Seiko Instruments Inc.
Tatsuya Miyatani
G01 - MEASURING TESTING
Information
Patent Grant
Scanning probe microscope
Patent number
6,710,339
Issue date
Mar 23, 2004
Seiko Instruments Inc.
Akira Egawa
G01 - MEASURING TESTING
Information
Patent Grant
Three-dimensional scanning probe microscope
Patent number
6,215,121
Issue date
Apr 10, 2001
Seiko Instruments Inc.
Masamichi Fujihira
B82 - NANO-TECHNOLOGY
Information
Patent Grant
Sampling scanning probe microscope and sampling method thereof
Patent number
6,094,972
Issue date
Aug 1, 2000
Seiko Instruments Inc.
Masatoshi Yasutake
B82 - NANO-TECHNOLOGY
Patents Applications
last 30 patents
Information
Patent Application
THIN-SLICE MANUFACTURING DEVICE AND THIN-SLICE MANUFACTURING METHOD
Publication number
20160139006
Publication date
May 19, 2016
SAKURA FINETEK JAPAN CO., LTD.
Tatsuya Miyatani
G01 - MEASURING TESTING
Information
Patent Application
THIN SECTION PREPARATION DEVICE
Publication number
20150300924
Publication date
Oct 22, 2015
SAKURA FINETEK JAPAN CO., LTD.
Tatsuya MIYATANI
G01 - MEASURING TESTING
Information
Patent Application
REPLACEMENT BLADE SUPPLYING MECHANISM
Publication number
20150268134
Publication date
Sep 24, 2015
SAKURA FINETEK JAPAN CO., LTD.
Tatsuya Miyatani
B26 - HAND CUTTING TOOLS CUTTING SEVERING
Information
Patent Application
AUTOMATIC THIN SECTION SAMPLE PREPARATION DEVICE
Publication number
20150268141
Publication date
Sep 24, 2015
SAKURA FINETEK JAPAN CO., LTD.
Tatsuya Miyatani
G01 - MEASURING TESTING
Information
Patent Application
THIN-SECTION SLIDES MANUFACTURING APPARATUS AND METHOD FOR MANUFACT...
Publication number
20100279342
Publication date
Nov 4, 2010
Yukimitsu KIJIMA
G01 - MEASURING TESTING
Information
Patent Application
Automatic Prepared Slide Fabricating Apparatus and Automatic Prepar...
Publication number
20100229702
Publication date
Sep 16, 2010
Koji Fujimoto
G01 - MEASURING TESTING
Information
Patent Application
THIN-SECTION MANUFACTURING APPARATUS
Publication number
20100050839
Publication date
Mar 4, 2010
Tatsuya Miyatani
G01 - MEASURING TESTING
Information
Patent Application
Automatic Thin-Section Slides Manufacturing System and Automated Th...
Publication number
20100030364
Publication date
Feb 4, 2010
Koji Fujimoto
G01 - MEASURING TESTING
Information
Patent Application
AUTOMATIC THIN-SECTION MANUFACTURING SYSTEM
Publication number
20080202308
Publication date
Aug 28, 2008
Hirohito Fujiwara
G01 - MEASURING TESTING
Information
Patent Application
Container for Processing Section Samples, Processing Method for Sec...
Publication number
20080088834
Publication date
Apr 17, 2008
Tatsuya Miyatani
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
Embedding cassette
Publication number
20080044315
Publication date
Feb 21, 2008
Koji Fujimoto
B01 - PHYSICAL OR CHEMICAL PROCESSES OR APPARATUS IN GENERAL
Information
Patent Application
THIN-SECTION CONVEYOR APPARATUS, THIN-SECTION SCOOPING TOOL, AND ME...
Publication number
20080044260
Publication date
Feb 21, 2008
Tatsuya Miyatani
G01 - MEASURING TESTING
Information
Patent Application
Identification code labeling tape
Publication number
20080044649
Publication date
Feb 21, 2008
SEIKO INSTRUMENTS INC.
Koji Fujimoto
G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information
Patent Application
Automatic sliced piece fabricating apparatus and automatic sliced p...
Publication number
20070204734
Publication date
Sep 6, 2007
Tetsumasa Ito
G01 - MEASURING TESTING
Information
Patent Application
Automatic instrument for fabricating prepared slide of tissue secti...
Publication number
20070204740
Publication date
Sep 6, 2007
Tatsuya Miyatani
G01 - MEASURING TESTING
Information
Patent Application
Automatic slicing apparatus
Publication number
20070180965
Publication date
Aug 9, 2007
Tetsumasa Ito
G01 - MEASURING TESTING
Information
Patent Application
Sectioning instrument
Publication number
20070157786
Publication date
Jul 12, 2007
Tatsuya Miyatani
G01 - MEASURING TESTING
Information
Patent Application
Scanning probe microscope
Publication number
20020079446
Publication date
Jun 27, 2002
Tatsuya Miyatani
B82 - NANO-TECHNOLOGY
Information
Patent Application
Scanning probe microscope
Publication number
20010030286
Publication date
Oct 18, 2001
Akira Egawa
B82 - NANO-TECHNOLOGY