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Tatsuya ONISHI
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Hamamatsu-shi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Image acquisition system and image acquisition method
Patent number
12,013,353
Issue date
Jun 18, 2024
Hamamatsu Photonics K.K.
Mototsugu Sugiyama
G01 - MEASURING TESTING
Information
Patent Grant
Image acquisition system and image acquisition method
Patent number
11,698,350
Issue date
Jul 11, 2023
Hamamatsu Photonics K.K.
Mototsugu Sugiyama
G01 - MEASURING TESTING
Information
Patent Grant
Image acquisition system and image acquisition method
Patent number
11,385,191
Issue date
Jul 12, 2022
Hamamatsu Photonics K.K.
Mototsugu Sugiyama
G01 - MEASURING TESTING
Information
Patent Grant
Radiation image acquisition system and radiation image acquisition...
Patent number
11,237,278
Issue date
Feb 1, 2022
Hamamatsu Photonics K.K.
Mototsugu Sugiyama
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Radiation detection device, radiation image acquisition device, and...
Patent number
11,079,344
Issue date
Aug 3, 2021
Hamamatsu Photonics K.K.
Toshiyasu Suyama
G01 - MEASURING TESTING
Information
Patent Grant
Radiation image acquisition system and radiation image acquisition...
Patent number
10,859,715
Issue date
Dec 8, 2020
Hamamatsu Photonics K.K.
Mototsugu Sugiyama
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Radiation image acquisition system and radiation image acquisition...
Patent number
10,698,120
Issue date
Jun 30, 2020
Hamamatsu Photonics K.K.
Mototsugu Sugiyama
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Radiation detection device, radiation inspection system, and method...
Patent number
10,677,938
Issue date
Jun 9, 2020
Hamamatsu Photonics K.K.
Tatsuya Onishi
G01 - MEASURING TESTING
Information
Patent Grant
Radiation detection device, radiation inspection system, and method...
Patent number
10,444,166
Issue date
Oct 15, 2019
Hamamatsu Photonics K.K.
Tatsuya Onishi
G01 - MEASURING TESTING
Information
Patent Grant
Image acquisition device and image acquisition method
Patent number
10,267,751
Issue date
Apr 23, 2019
Hamamatsu Photonics K.K.
Toshiyasu Suyama
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
OPTICAL IMAGE PROCESSING METHOD, MACHINE LEARNING METHOD, TRAINED M...
Publication number
20240265508
Publication date
Aug 8, 2024
Hamamatsu Photonics K.K.
Tatsuya ONISHI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
OPTICAL IMAGE PROCESSING METHOD, MACHINE LEARNING METHOD, TRAINED M...
Publication number
20240257317
Publication date
Aug 1, 2024
Hamamatsu Photonics K.K.
Satoshi TSUCHIYA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
RADIOGRAPHIC IMAGE ACQUIRING DEVICE, RADIOGRAPHIC IMAGE ACQUIRING S...
Publication number
20240210331
Publication date
Jun 27, 2024
Hamamatsu Photonics K.K.
Tatsuya ONISHI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
RADIOGRAPHIC IMAGE PROCESSING METHOD, MACHINE-LEARNING METHOD, TRAI...
Publication number
20240054617
Publication date
Feb 15, 2024
Hamamatsu Photonics K.K.
Satoshi TSUCHIYA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
IMAGE ACQUISITION SYSTEM AND IMAGE ACQUISITION METHOD
Publication number
20230296535
Publication date
Sep 21, 2023
HAMAMATSU PHOTONICS K. K.
Mototsugu SUGIYAMA
G01 - MEASURING TESTING
Information
Patent Application
RADIOGRAPHIC IMAGE PROCESSING METHOD, TRAINED MODEL, RADIOGRAPHIC I...
Publication number
20230136930
Publication date
May 4, 2023
Hamamatsu Photonics K.K.
Toshiyasu SUYAMA
G01 - MEASURING TESTING
Information
Patent Application
RADIOGRAPHIC IMAGE ACQUIRING DEVICE, RADIOGRAPHIC IMAGE ACQUIRING S...
Publication number
20230135988
Publication date
May 4, 2023
Hamamatsu Photonics K.K.
Tatsuya ONISHI
G01 - MEASURING TESTING
Information
Patent Application
RADIOGRAPHIC INSPECTION METHOD, RADIOGRAPHIC INSPECTION APPARATUS,...
Publication number
20230128795
Publication date
Apr 27, 2023
Hamamatsu Photonics K.K.
Tatsuya ONISHI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
RADIOGRAPHY METHOD, TRAINED MODEL, RADIOGRAPHY MODULE, RADIOGRAPHY...
Publication number
20230125182
Publication date
Apr 27, 2023
Hamamatsu Photonics K.K.
Tatsuya ONISHI
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
IMAGE ACQUISITION SYSTEM AND IMAGE ACQUISITION METHOD
Publication number
20220291150
Publication date
Sep 15, 2022
HAMAMATSU PHOTONICS K. K.
Mototsugu SUGIYAMA
G01 - MEASURING TESTING
Information
Patent Application
IMAGE ACQUISITION SYSTEM AND IMAGE ACQUISITION METHOD
Publication number
20210003518
Publication date
Jan 7, 2021
Hamamatsu Photonics K.K.
Mototsugu SUGIYAMA
G01 - MEASURING TESTING
Information
Patent Application
RADIATION IMAGE ACQUISITION SYSTEM AND RADIATION IMAGE ACQUISITION...
Publication number
20200292718
Publication date
Sep 17, 2020
HAMAMATSU PHOTONICS K. K.
Mototsugu SUGIYAMA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
RADIATION DETECTION DEVICE, RADIATION IMAGE ACQUISITION DEVICE, AND...
Publication number
20200057008
Publication date
Feb 20, 2020
Hamamatsu Photonics K.K.
Toshiyasu SUYAMA
G01 - MEASURING TESTING
Information
Patent Application
RADIATION DETECTION DEVICE, RADIATION INSPECTION SYSTEM, AND METHOD...
Publication number
20190003990
Publication date
Jan 3, 2019
Hamamatsu Photonics K.K.
Tatsuya ONISHI
G01 - MEASURING TESTING
Information
Patent Application
RADIATION DETECTION DEVICE, RADIATION INSPECTION SYSTEM, AND METHOD...
Publication number
20180364370
Publication date
Dec 20, 2018
Hamamatsu Photonics K.K.
Tatsuya ONISHI
G01 - MEASURING TESTING
Information
Patent Application
RADIATION IMAGE ACQUISITION SYSTEM AND RADIATION IMAGE ACQUISITION...
Publication number
20180306931
Publication date
Oct 25, 2018
Hamamatsu Photonics K.K.
Mototsugu SUGIYAMA
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
IMAGE ACQUISITION DEVICE AND IMAGE ACQUISITION METHOD
Publication number
20170038314
Publication date
Feb 9, 2017
Hamamatsu Ohotonics K.K.
Toshiyasu SUYAMA
G01 - MEASURING TESTING