Tatsuya OODAKE

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Zushi-shi, JP

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Patents Grantslast 30 patents

Information Patent Grant
Eddy-current flaw detector and eddy-current flaw detection method
- Patent number 10,317,367
- Issue date Jun 11, 2019
- Kabushiki Kaisha Toshiba
- Noriyasu Kobayashi
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Three-dimensional distance measurement apparatus and method therefor
- Patent number 9,214,024
- Issue date Dec 15, 2015
- Kabushiki Kaisha Toshiba
- Tatsuya Oodake
- G01 - MEASURING TESTING
Information Patent Grant
Visual inspection apparatus and visual inspection method
- Patent number 8,976,242
- Issue date Mar 10, 2015
- Kabushiki Kaisha Toshiba
- Tetsuro Aikawa
- G01 - MEASURING TESTING
Information Patent Grant
Apparatus for inspecting and measuring object to be measured
- Patent number 8,483,444
- Issue date Jul 9, 2013
- Kabushiki Kaisha Toshiba
- Tetsuro Aikawa
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
EDDY-CURRENT FLAW DETECTOR AND EDDY-CURRENT FLAW DETECTION METHOD
- Publication number 20170336361
- Publication date Nov 23, 2017
- KABUSHIKI KAISHA TOSHIBA
- Noriyasu KOBAYASHI
- G01 - MEASURING TESTING
Information Patent Application
WELDING APPARATUS AND WELDING METHOD
- Publication number 20130026148
- Publication date Jan 31, 2013
- Kazuo AOYAMA
- B23 - MACHINE TOOLS METAL-WORKING NOT OTHERWISE PROVIDED FOR
Information Patent Application
THREE-DIMENSIONAL DISTANCE MEASUREMENT APPARATUS AND METHOD THEREFOR
- Publication number 20130021452
- Publication date Jan 24, 2013
- Kabushiki Kaisha Toshiba
- Tatsuya Oodake
- G01 - MEASURING TESTING
Information Patent Application
VISUAL INSPECTION APPARATUS AND VISUAL INSPECTION METHOD
- Publication number 20100283847
- Publication date Nov 11, 2010
- Kabushiki Kaisha Toshiba
- Tetsuro Aikawa
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
APPARATUS FOR INSPECTING AND MEASURING OBJECT TO BE MEASURED
- Publication number 20100183197
- Publication date Jul 22, 2010
- KABUSHIKI KAISHA TOSHIBA
- Tetsuro Aikawa
- G01 - MEASURING TESTING