Tatsuya SUMIYA

Person

Tokyo, JP

People

Patents Grantslast 30 patents

Information Patent Grant
Radar device, imaging method, and imaging program
- Patent number 12,085,666
- Issue date Sep 10, 2024
- NEC Corporation
- Tatsuya Sumiya
- G01 - MEASURING TESTING
Information Patent Grant
Inspection system for inspecting contents of a target person, and i...
- Patent number 11,914,035
- Issue date Feb 27, 2024
- NEC Corporation
- Tatsuya Sumiya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Inspection system and inspection method
- Patent number 11,860,112
- Issue date Jan 2, 2024
- NEC Corporation
- Naoya Nakayama
- G01 - MEASURING TESTING
Information Patent Grant
Systems and methods for determining contents of a belongings inspec...
- Patent number 11,815,597
- Issue date Nov 14, 2023
- NEC Corporation
- Shingo Yamanouchi
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
TARGET OBJECT DETECTION APPARATUS, TARGET OBJECT DETECTION METHOD,...
- Publication number 20240125929
- Publication date Apr 18, 2024
- NEC Corporation
- Tatsuya SUMIYA
- G01 - MEASURING TESTING
Information Patent Application
RADAR APPARATUS, IMAGING METHOD, AND NON-TRANSITORY COMPUTER-READAB...
- Publication number 20230417901
- Publication date Dec 28, 2023
- NEC Corporation
- Tatsuya SUMIYA
- G01 - MEASURING TESTING
Information Patent Application
DATA PROCESSING APPARATUS, DATA PROCESSING METHOD, AND NON-TRANSITO...
- Publication number 20230342879
- Publication date Oct 26, 2023
- NEC Corporation
- Kazumine OGURA
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION SYSTEM FOR INSPECTING CONTENTS OF A TARGET PERSON, AND I...
- Publication number 20230288560
- Publication date Sep 14, 2023
- NEC Corporation
- Tatsuya Sumiya
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
PROCESSING SYSTEM, PROCESSING METHOD, AND NON-TRANSITORY STORAGE ME...
- Publication number 20230123120
- Publication date Apr 20, 2023
- NEC Corporation
- Masayuki Ariyoshi
- G05 - CONTROLLING REGULATING
Information Patent Application
OBJECT DETECTION APPARATUS, SYSTEM, AND METHOD, DATA CONVERSION UNI...
- Publication number 20230045129
- Publication date Feb 9, 2023
- NEC Corporation
- Nagma Samreen KHAN
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
OBJECT DETECTION APPARATUS, OBJECT DETECTION METHOD, AND COMPUTER-R...
- Publication number 20220413115
- Publication date Dec 29, 2022
- NEC Corporation
- Shingo YAMANOUCHI
- G01 - MEASURING TESTING
Information Patent Application
IMAGE GENERATION APPARATUS, IMAGE GENERATION METHOD, AND NON-TRANSI...
- Publication number 20220366614
- Publication date Nov 17, 2022
- NEC Corporation
- Masayuki ARIYOSHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
RADAR APPARATUS, IMAGING METHOD, AND NON-TRANSITORY STORAGE MEDIUM
- Publication number 20220350016
- Publication date Nov 3, 2022
- NEC Corporation
- Tatsuya SUMIYA
- G01 - MEASURING TESTING
Information Patent Application
PROCESSING APPARATUS, PROCESSING METHOD, AND NON-TRANSITORY STORAGE...
- Publication number 20220335724
- Publication date Oct 20, 2022
- NEC Corporation
- Masayuki ARIYOSHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION SYSTEM AND INSPECTION METHOD
- Publication number 20220299454
- Publication date Sep 22, 2022
- NEC Corporation
- Naoya NAKAYAMA
- G01 - MEASURING TESTING
Information Patent Application
OBJECT DETECTION APPARATUS, OBJECT DETECTION METHOD,AND NON-TRANSIT...
- Publication number 20220299602
- Publication date Sep 22, 2022
- NEC Corporation
- Shingo YAMANOUCHI
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM AND INSPECTION METHOD
- Publication number 20220299631
- Publication date Sep 22, 2022
- NEC Corporation
- Shinichi MORIMOTO
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INSPECTION SYSTEM AND INSPECTION METHOD
- Publication number 20220299637
- Publication date Sep 22, 2022
- NEC Corporation
- Shingo YAMANOUCHI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
RADAR SYSTEM, IMAGING METHOD, AND IMAGING PROGRAM
- Publication number 20220268915
- Publication date Aug 25, 2022
- NEC Corporation
- Kazumine OGURA
- G01 - MEASURING TESTING
Information Patent Application
RADAR DEVICE, IMAGING METHOD, AND IMAGING PROGRAM
- Publication number 20220260673
- Publication date Aug 18, 2022
- NEC Corporation
- Tatsuya SUMIYA
- G01 - MEASURING TESTING
Information Patent Application
INSPECTION SYSTEM AND INSPECTION METHOD
- Publication number 20220244377
- Publication date Aug 4, 2022
- NEC Corporation
- Masayuki ARIYOSHI
- E06 - DOORS, WINDOWS, SHUTTERS, OR ROLLER BLINDS IN GENERAL LADDERS
Information Patent Application
RADAR SYSTEM AND IMAGING METHOD
- Publication number 20220171052
- Publication date Jun 2, 2022
- NEC Corporation
- Kazumine OGURA
- G01 - MEASURING TESTING

Tatsuya SUMIYA

Person

Patents Grantslast 30 patents

Radar device, imaging method, and imaging program

Inspection system for inspecting contents of a target person, and i...

Inspection system and inspection method

Systems and methods for determining contents of a belongings inspec...

Patents Applicationslast 30 patents

TARGET OBJECT DETECTION APPARATUS, TARGET OBJECT DETECTION METHOD,...

RADAR APPARATUS, IMAGING METHOD, AND NON-TRANSITORY COMPUTER-READAB...

DATA PROCESSING APPARATUS, DATA PROCESSING METHOD, AND NON-TRANSITO...

INSPECTION SYSTEM FOR INSPECTING CONTENTS OF A TARGET PERSON, AND I...

PROCESSING SYSTEM, PROCESSING METHOD, AND NON-TRANSITORY STORAGE ME...

OBJECT DETECTION APPARATUS, SYSTEM, AND METHOD, DATA CONVERSION UNI...

OBJECT DETECTION APPARATUS, OBJECT DETECTION METHOD, AND COMPUTER-R...

IMAGE GENERATION APPARATUS, IMAGE GENERATION METHOD, AND NON-TRANSI...

RADAR APPARATUS, IMAGING METHOD, AND NON-TRANSITORY STORAGE MEDIUM

PROCESSING APPARATUS, PROCESSING METHOD, AND NON-TRANSITORY STORAGE...

INSPECTION SYSTEM AND INSPECTION METHOD

OBJECT DETECTION APPARATUS, OBJECT DETECTION METHOD,AND NON-TRANSIT...

INSPECTION SYSTEM AND INSPECTION METHOD

INSPECTION SYSTEM AND INSPECTION METHOD

RADAR SYSTEM, IMAGING METHOD, AND IMAGING PROGRAM

RADAR DEVICE, IMAGING METHOD, AND IMAGING PROGRAM

INSPECTION SYSTEM AND INSPECTION METHOD

RADAR SYSTEM AND IMAGING METHOD