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Tatuhisa Fujii
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Fukuyama-shi, JP
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Patents Grants
last 30 patents
Information
Patent Grant
Inspection apparatus for conductive patterns of a circuit board, an...
Patent number
6,861,863
Issue date
Mar 1, 2005
OHT Inc.
Shogo Ishioka
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for inspecting a board used in a liquid crysta...
Patent number
6,859,062
Issue date
Feb 22, 2005
OHT Inc.
Tatuhisa Fujii
G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information
Patent Grant
Inspection apparatus and sensor
Patent number
6,734,692
Issue date
May 11, 2004
OHT Inc.
Tatuhisa Fujii
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus for inspection
Patent number
6,710,607
Issue date
Mar 23, 2004
OHT, Inc.
Tatuhisa Fujii
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Inspection apparatus and inspection method
Publication number
20030117164
Publication date
Jun 26, 2003
Tatuhisa Fujii
G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information
Patent Application
Tester and holder for tester
Publication number
20020140445
Publication date
Oct 3, 2002
Shogo Ishioka
G01 - MEASURING TESTING
Information
Patent Application
Inspection apparatus and sensor
Publication number
20020140448
Publication date
Oct 3, 2002
Tatuhisa Fujii
G01 - MEASURING TESTING
Information
Patent Application
Method and apparatus for inspection
Publication number
20020135390
Publication date
Sep 26, 2002
Tatuhisa Fujii
G01 - MEASURING TESTING