Tatum M Sheffield

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Missouri City, TX, US

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Patents Grantslast 30 patents

Information Patent Grant
System and method for analyzing seismic data background
- Patent number 9,046,625
- Issue date Jun 2, 2015
- Chevron U.S.A. Inc.
- Tatum Michael Sheffield
- G01 - MEASURING TESTING
Information Patent Grant
System and method for analyzing a region of interest relative to a...
- Patent number 7,002,576
- Issue date Feb 21, 2006
- Magic Earth, Inc.
- Tatum M. Sheffield
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for analyzing and imaging an enhanced three-dimen...
- Patent number 6,987,878
- Issue date Jan 17, 2006
- Magic Earth, Inc.
- Jack Lees
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for analyzing and imaging and enhanced three-dime...
- Patent number 6,690,820
- Issue date Feb 10, 2004
- Magic Earth, Inc.
- Jack Lees
- G06 - COMPUTING CALCULATING COUNTING

Patents Applicationslast 30 patents

Information Patent Application
SYSTEM AND METHOD FOR ANALYZING SEISMIC DATA BACKGROUND
- Publication number 20130083626
- Publication date Apr 4, 2013
- Chevron U.S.A. Inc.
- Tatum Michael Sheffield
- G01 - MEASURING TESTING
Information Patent Application
System and method for analyzing and imaging an enhanced three-dimen...
- Publication number 20050213809
- Publication date Sep 29, 2005
- Jack Lees
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and method for analyzing a region of interest relative to a...
- Publication number 20050110795
- Publication date May 26, 2005
- Magic Earth, Inc.
- Tatum M. Sheffield
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and method for analyzing and imaging an enhanced three-dimen...
- Publication number 20040081353
- Publication date Apr 29, 2004
- Jack Lees
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
System and method for analyzing and imaging and enhanced three-dime...
- Publication number 20020172401
- Publication date Nov 21, 2002
- Jack Lees
- G01 - MEASURING TESTING