Tawfik R. Arabi

Person

Tigard, OR, US

People

Patents Grantslast 30 patents

Information Patent Grant
Per die temperature programming for thermally efficient integrated...
- Patent number 8,461,895
- Issue date Jun 11, 2013
- Intel Corporation
- Tawfik Arabi
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Per die temperature programming for thermally efficient integrated...
- Patent number 8,044,697
- Issue date Oct 25, 2011
- Intel Corporation
- Tawfik Arabi
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Per die voltage programming for energy efficient integrated circuit...
- Patent number 7,685,445
- Issue date Mar 23, 2010
- Intel Corporation
- Tawfik Arabi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
AC testing of leakage current in integrated circuits using RC time...
- Patent number 7,348,790
- Issue date Mar 25, 2008
- Intel Corporation
- Tawfik R. Arabi
- G01 - MEASURING TESTING
Information Patent Grant
Arrangements having IC voltage and thermal resistance designated on...
- Patent number 7,233,162
- Issue date Jun 19, 2007
- Intel Corporation
- Tawfik Arabi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for on-die voltage fluctuation detection
- Patent number 7,157,924
- Issue date Jan 2, 2007
- Intel Corporation
- Ali Muhtaroglu
- G01 - MEASURING TESTING
Information Patent Grant
On-die temperature control data for communicating to a thermal actu...
- Patent number 7,117,114
- Issue date Oct 3, 2006
- Intel Corporation
- Tawfik Arabi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Testing arrangement to distribute integrated circuits
- Patent number 7,112,979
- Issue date Sep 26, 2006
- Intel Corporation
- Tawfik Arabi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Arrangements having IC voltage and thermal resistance designated on...
- Patent number 7,109,737
- Issue date Sep 19, 2006
- Intel Corporation
- Tawfik Arabi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
AC testing of leakage current in integrated circuits using RC time...
- Patent number 6,967,496
- Issue date Nov 22, 2005
- Intel Corporation
- Tawfik R. Arabi
- G01 - MEASURING TESTING
Information Patent Grant
AC testing of leakage current in integrated circuits using RC time...
- Patent number 6,777,970
- Issue date Aug 17, 2004
- Intel Corporation
- Tawfik R. Arabi
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for on-die voltage fluctuation detection
- Patent number 6,747,470
- Issue date Jun 8, 2004
- Intel Corporation
- Ali Muhtaroglu
- G01 - MEASURING TESTING
Information Patent Grant
I/O device testing method and apparatus
- Patent number 6,671,847
- Issue date Dec 30, 2003
- Intel Corporation
- Chi-Yeu Chao
- G11 - INFORMATION STORAGE
Information Patent Grant
Test and characterization of source synchronous AC timing specifica...
- Patent number 6,449,742
- Issue date Sep 10, 2002
- Intel Corporation
- Tawfik Arabi
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PER DIE TEMPERATURE PROGRAMMING FOR THERMALLY EFFICIENT INTEGRATED...
- Publication number 20120133578
- Publication date May 31, 2012
- Tawfik Arabi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Per die temperature programming for thermally efficient integrated...
- Publication number 20080001634
- Publication date Jan 3, 2008
- Tawfik Arabi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Per die voltage programming for energy efficient integrated circuit...
- Publication number 20080001795
- Publication date Jan 3, 2008
- Tawfik Arabi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and apparatus to adjust die frequency
- Publication number 20060226863
- Publication date Oct 12, 2006
- Siva G. Narendra
- G01 - MEASURING TESTING
Information Patent Application
On-die temperature control data for communicating to a thermal actu...
- Publication number 20060052970
- Publication date Mar 9, 2006
- Tawfik Arabi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AC testing of leakage current in integrated circuits using RC time...
- Publication number 20060033522
- Publication date Feb 16, 2006
- Intel Corporation
- Tawfik R. Arabi
- G01 - MEASURING TESTING
Information Patent Application
Arrangements having IC voltage and thermal resistance designated on...
- Publication number 20050247605
- Publication date Nov 10, 2005
- Tawfik Arabi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
AC testing of leakage current in integrated circuits using RC time...
- Publication number 20040246017
- Publication date Dec 9, 2004
- Intel Corporation
- Tawfik R. Arabi
- G01 - MEASURING TESTING
Information Patent Application
Arrangements having IC voltage and thermal resistance designated on...
- Publication number 20040224430
- Publication date Nov 11, 2004
- Tawfik Arabi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and apparatus to provide platform load lines
- Publication number 20040117673
- Publication date Jun 17, 2004
- Tawfik Arabi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and apparatus for on-die voltage fluctuation detection
- Publication number 20040085085
- Publication date May 6, 2004
- Ali Muhtaroglu
- G01 - MEASURING TESTING
Information Patent Application
Arrangements having IC voltage and thermal resistance designated on...
- Publication number 20040082086
- Publication date Apr 29, 2004
- Tawfik Arabi
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Method and apparatus for on-die voltage fluctuation detection
- Publication number 20030112027
- Publication date Jun 19, 2003
- Ali Muhtaroglu
- G01 - MEASURING TESTING
Information Patent Application
AC testing of leakage current
- Publication number 20020153914
- Publication date Oct 24, 2002
- Intel Corporation
- Tawfik R. Arabi
- G01 - MEASURING TESTING

Tawfik R. Arabi

Person

Patents Grantslast 30 patents

Per die temperature programming for thermally efficient integrated...

Per die temperature programming for thermally efficient integrated...

Per die voltage programming for energy efficient integrated circuit...

AC testing of leakage current in integrated circuits using RC time...

Arrangements having IC voltage and thermal resistance designated on...

Method and apparatus for on-die voltage fluctuation detection

On-die temperature control data for communicating to a thermal actu...

Testing arrangement to distribute integrated circuits

Arrangements having IC voltage and thermal resistance designated on...

AC testing of leakage current in integrated circuits using RC time...

AC testing of leakage current in integrated circuits using RC time...

Method and apparatus for on-die voltage fluctuation detection

I/O device testing method and apparatus

Test and characterization of source synchronous AC timing specifica...

Patents Applicationslast 30 patents

PER DIE TEMPERATURE PROGRAMMING FOR THERMALLY EFFICIENT INTEGRATED...

Per die temperature programming for thermally efficient integrated...

Per die voltage programming for energy efficient integrated circuit...

Method and apparatus to adjust die frequency

On-die temperature control data for communicating to a thermal actu...

AC testing of leakage current in integrated circuits using RC time...

Arrangements having IC voltage and thermal resistance designated on...

AC testing of leakage current in integrated circuits using RC time...

Arrangements having IC voltage and thermal resistance designated on...

Method and apparatus to provide platform load lines

Method and apparatus for on-die voltage fluctuation detection

Arrangements having IC voltage and thermal resistance designated on...

Method and apparatus for on-die voltage fluctuation detection

AC testing of leakage current