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Tay Bok Her
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Melaka, MY
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Patents Grants
last 30 patents
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Patent Grant
Post-seal inspection system and method
Patent number
6,545,754
Issue date
Apr 8, 2003
Asti Holdings, Limited
Tay Bok Her
G01 - MEASURING TESTING
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Patent Grant
Post-seal inspection system and method
Patent number
6,396,578
Issue date
May 28, 2002
Semiconductor Technologies & Instruments, Inc.
Tay Bok Her
G01 - MEASURING TESTING
Information
Patent Grant
Post-seal inspection system and method
Patent number
6,259,522
Issue date
Jul 10, 2001
Semiconductor Technologies & Instruments, Inc.
Tay Bok Her
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
Post-seal inspection system and method
Publication number
20020105637
Publication date
Aug 8, 2002
Tay Bok Her
G01 - MEASURING TESTING
Information
Patent Application
Post-seal inspection system and method
Publication number
20010028453
Publication date
Oct 11, 2001
Tay Bok Her
G01 - MEASURING TESTING