Te-Chen Feng

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Hsinchu Hsiang, TW

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Patents Grantslast 30 patents

Information Patent Grant
Probing device
- Patent number 7,782,070
- Issue date Aug 24, 2010
- MJC Probe Incorporated
- Wei-Cheng Ku
- G01 - MEASURING TESTING
Information Patent Grant
High-frequency probe card and transmission line for high-frequency...
- Patent number 7,683,645
- Issue date Mar 23, 2010
- MPI Corporation
- Wei-Cheng Ku
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
PROBING DEVICE
- Publication number 20090009198
- Publication date Jan 8, 2009
- MJC Probe Incorporation
- Wei-Cheng Ku
- G01 - MEASURING TESTING
Information Patent Application
High-frequency probe card and transmission line for high-frequency...
- Publication number 20080007278
- Publication date Jan 10, 2008
- MJC Probe Incorporation
- Wei-Cheng Ku
- G01 - MEASURING TESTING