Te-Hsun Huang

Person

Chu-Pei, TW

People

Patents Grantslast 30 patents

Information Patent Grant
Method for inspecting pattern defects
- Patent number 12,196,687
- Issue date Jan 14, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd
- Ju-Ying Chen
- G01 - MEASURING TESTING
Information Patent Grant
Multi-function overlay marks for reducing noise and extracting focu...
- Patent number 12,055,860
- Issue date Aug 6, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd
- Yu-Ching Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Multi-function overlay marks for reducing noise and extracting focu...
- Patent number 11,835,864
- Issue date Dec 5, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Yu-Ching Lee
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Methods of defect inspection
- Patent number 11,624,985
- Issue date Apr 11, 2023
- Taiwan Semiconductor Manufacturing Co., Ltd
- Ta-Ching Yu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multi-function overlay marks for reducing noise and extracting focu...
- Patent number 11,448,975
- Issue date Sep 20, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd
- Yu-Ching Lee
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Touch display panel
- Patent number 11,068,093
- Issue date Jul 20, 2021
- Au Optronics Corporation
- Te-Chun Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Multi-function overlay marks for reducing noise and extracting focu...
- Patent number 10,915,017
- Issue date Feb 9, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd
- Yu-Ching Lee
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Methods of defect inspection
- Patent number 10,795,270
- Issue date Oct 6, 2020
- Taiwan Semiconductor Manufacturing Co., Ltd
- Ta-Ching Yu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method of determining critical-dimension-related properties, inspec...
- Patent number 10,180,628
- Issue date Jan 15, 2019
- ASML Netherlands B.V.
- Hugo Augustinus Joseph Cramer
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Metrology method and apparatus, substrates for use in such methods,...
- Patent number 10,162,272
- Issue date Dec 25, 2018
- ASML Netherlands B.V.
- Martin Jacobus Johan Jak
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Metrology method and apparatus
- Patent number 9,903,823
- Issue date Feb 27, 2018
- ASML Netherlands B.V.
- Yen-Wen Lu
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Manufacturing method of pixel structure with data line, scan line a...
- Patent number 9,449,998
- Issue date Sep 20, 2016
- Au Optronics Corporation
- Te-Chun Huang
- G02 - OPTICS
Information Patent Grant
Display panel
- Patent number 9,423,660
- Issue date Aug 23, 2016
- Au Optronics Corporation
- Te-Chun Huang
- G09 - EDUCATION CRYPTOGRAPHY DISPLAY ADVERTISING SEALS
Information Patent Grant
Measurement of overlay offset in semiconductor processing
- Patent number RE45943
- Issue date Mar 22, 2016
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Te-Chih Huang
- 001 -
Information Patent Grant
Pixel structure with data line, scan line and gate electrode formed...
- Patent number 9,239,502
- Issue date Jan 19, 2016
- Au Optronics Corporation
- Te-Chun Huang
- G02 - OPTICS
Information Patent Grant
Extraction of systematic defects
- Patent number 9,201,022
- Issue date Dec 1, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jia-Rui Hu
- G01 - MEASURING TESTING
Information Patent Grant
Display panel
- Patent number 9,146,429
- Issue date Sep 29, 2015
- Au Optronics Corporation
- Te-Chun Huang
- G02 - OPTICS
Information Patent Grant
Method of defining an intensity selective exposure photomask
- Patent number 9,026,957
- Issue date May 5, 2015
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Chia-Chu Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
System and method for alignment in semiconductor device fabrication
- Patent number 8,837,810
- Issue date Sep 16, 2014
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Yen-Liang Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Panel and method for fabricating the same
- Patent number 8,772,796
- Issue date Jul 8, 2014
- AU Optronics Corp.
- Kuo-Yu Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Array substrate structure of display panel and method of making the...
- Patent number 8,772,780
- Issue date Jul 8, 2014
- AU Optronics Corp.
- Kuo-Yu Huang
- G02 - OPTICS
Information Patent Grant
Detecting method for forming semiconductor device
- Patent number 8,755,045
- Issue date Jun 17, 2014
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jyuh-Fuh Lin
- G01 - MEASURING TESTING
Information Patent Grant
Intensity selective exposure photomask
- Patent number 8,673,520
- Issue date Mar 18, 2014
- Taiwan Semiconductor Manufacturing Company, Ltd.
- George Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Intensity selective exposure photomask
- Patent number 8,431,291
- Issue date Apr 30, 2013
- Taiwan Semiconductor Manufacturing Company, Ltd.
- George Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Display panel with driving circuit and common electrode within sealant
- Patent number 8,237,904
- Issue date Aug 7, 2012
- Au Optronics Corporation
- Maw-Song Chen
- G02 - OPTICS
Information Patent Grant
Measurement of overlay offset in semiconductor processing
- Patent number 8,179,536
- Issue date May 15, 2012
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Te-Chih Huang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Display panel with driving circuit and common electrode within seal...
- Patent number 8,120,742
- Issue date Feb 21, 2012
- Au Optronics Corporation
- Maw-Song Chen
- G02 - OPTICS
Information Patent Grant
Intensity selective exposure method and apparatus
- Patent number 8,003,303
- Issue date Aug 23, 2011
- Taiwan Semiconductor Manufacturing Company, Ltd.
- George Liu
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Measurement of overlay offset in semiconductor processing
- Patent number 7,858,404
- Issue date Dec 28, 2010
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Te-Chih Huang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Mask haze early detection
- Patent number 7,796,249
- Issue date Sep 14, 2010
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Wen-Chuan Wang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY

Patents Applicationslast 30 patents

Information Patent Application
METHOD FOR INSPECTING PATTERN DEFECTS
- Publication number 20250093278
- Publication date Mar 20, 2025
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Ju-Ying CHEN
- G01 - MEASURING TESTING
Information Patent Application
Multi-Function Overlay Marks for Reducing Noise and Extracting Focu...
- Publication number 20240012340
- Publication date Jan 11, 2024
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Yu-Ching Lee
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Multi-Function Overlay Marks for Reducing Noise and Extracting Focu...
- Publication number 20220384358
- Publication date Dec 1, 2022
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Yu-Ching Lee
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METHOD FOR INSPECTING PATTERN DEFECTS
- Publication number 20210270751
- Publication date Sep 2, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Ju-Ying CHEN
- G01 - MEASURING TESTING
Information Patent Application
Multi-Function Overlay Marks for Reducing Noise and Extracting Focu...
- Publication number 20210165315
- Publication date Jun 3, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Yu-Ching Lee
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHODS OF DEFECT INSPECTION
- Publication number 20210018848
- Publication date Jan 21, 2021
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Ta-Ching YU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
TOUCH DISPLAY PANEL
- Publication number 20200225793
- Publication date Jul 16, 2020
- AU OPTRONICS CORPORATION
- Te-Chun Huang
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
MULTI-FUNCTION OVERLAY MARKS FOR REDUCING NOISE AND EXTRACTING FOCU...
- Publication number 20190064654
- Publication date Feb 28, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Yu-Ching Lee
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHODS OF DEFECT INSPECTION
- Publication number 20190064675
- Publication date Feb 28, 2019
- Taiwan Semiconductor Manufacturing Co., Ltd.
- Ta-Ching YU
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METROLOGY METHOD AND APPARATUS, SUBSTRATES FOR USE IN SUCH METHODS,...
- Publication number 20170052454
- Publication date Feb 23, 2017
- ASML NETHERLANDS B.V.
- Martin Jacobus Johan JAK
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
DISPLAY PANEL
- Publication number 20160155752
- Publication date Jun 2, 2016
- AU OPTRONICS CORPORATION
- Te-Chun Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
METROLOGY METHOD AND APPARATUS
- Publication number 20160146740
- Publication date May 26, 2016
- ASML NETHERLANDS B.V.
- Yen-Wen Lu
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF DETERMINING CRITICAL-DIMENSION-RELATED PROPERTIES, INSPEC...
- Publication number 20160116849
- Publication date Apr 28, 2016
- ASML NETHERLANDS B.V.
- Hugo Augustinus Joseph CRAMER
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
PIXEL STRUCTURE AND MANUFACTURING METHOD THEREOF
- Publication number 20160111446
- Publication date Apr 21, 2016
- AU OPTRONICS CORPORATION
- Te-Chun Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
DISPLAY PANEL
- Publication number 20150138465
- Publication date May 21, 2015
- AU OPTRONICS CORPORATION
- Te-Chun Huang
- G02 - OPTICS
Information Patent Application
METHOD OF DEFINING AN INTENSITY SELECTIVE EXPOSURE PHOTOMASK
- Publication number 20140170537
- Publication date Jun 19, 2014
- Taiwan Semiconductor Manufacturing Company, Ltd.
- George Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
SYSTEM AND METHOD FOR ALIGNMENT IN SEMICONDUCTOR DEVICE FABRICATION
- Publication number 20130259358
- Publication date Oct 3, 2013
- Taiwan Semiconductor Manufacturing Company, Ltd., ("TSMC")
- Yen-Liang Chen
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
DETECTING METHOD FOR FORMING SEMICONDUCTOR DEVICE
- Publication number 20130176558
- Publication date Jul 11, 2013
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jyuh-Fuh Lin
- G01 - MEASURING TESTING
Information Patent Application
ARRAY SUBSTRATE STRUCTURE OF DISPLAY PANEL AND METHOD OF MAKING THE...
- Publication number 20130168707
- Publication date Jul 4, 2013
- AU OPTRONICS CORP.
- Kuo-Yu Huang
- G02 - OPTICS
Information Patent Application
Panel and method for fabricating the same
- Publication number 20130168704
- Publication date Jul 4, 2013
- Kuo-Yu Huang
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
PIXEL STRUCTURE AND MANUFACTURING METHOD THEREOF
- Publication number 20130161604
- Publication date Jun 27, 2013
- AU OPTRONICS CORPORATION
- Te-Chun Huang
- G02 - OPTICS
Information Patent Application
EXTRACTION OF SYSTEMATIC DEFECTS
- Publication number 20120308112
- Publication date Dec 6, 2012
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Jia-Rui Hu
- G01 - MEASURING TESTING
Information Patent Application
APPARATUS AND METHOD FOR ELIMINATING GLARE
- Publication number 20120268626
- Publication date Oct 25, 2012
- AVERMEDIA INFORMATION, INC.
- Chun-Wei LU
- H04 - ELECTRIC COMMUNICATION TECHNIQUE
Information Patent Application
DISPLAY PANEL
- Publication number 20120092578
- Publication date Apr 19, 2012
- AU OPTRONICS CORPORATION
- Maw-Song Chen
- G02 - OPTICS
Information Patent Application
INTENSITY SELECTIVE EXPOSURE PHOTOMASK
- Publication number 20120040278
- Publication date Feb 16, 2012
- Taiwan Semiconductor Manufacturing Company, Ltd., ("TSMC")
- George Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
INTENSITY SELECTIVE EXPOSURE PHOTOMASK
- Publication number 20110217630
- Publication date Sep 8, 2011
- Taiwan Semiconductor Manufacturing Company, Ltd., ("TSMC")
- George Liu
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Measurement Of Overlay Offset In Semiconductor Processing
- Publication number 20110131007
- Publication date Jun 2, 2011
- Taiwan Semiconductor Manufacturing Company, Ltd.
- Te-Chih Huang
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Intensity Selective Exposure Method And Apparatus
- Publication number 20100261118
- Publication date Oct 14, 2010
- Taiwan Semiconductor Manufacturing Company, Ltd.
- George Liu
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
PIXEL ARRAY AND MANUFACTURING METHOD THEREOF
- Publication number 20100149473
- Publication date Jun 17, 2010
- AU OPTRONICS CORPORATION
- Tsai-Hua Guo
- G02 - OPTICS
Information Patent Application
DISPLAY PANEL AND MANUFACTURING METHOD THEREOF
- Publication number 20100045912
- Publication date Feb 25, 2010
- AU OPTRONICS CORPORATION
- Maw-Song Chen
- G02 - OPTICS

Te-Hsun Huang

Person

Patents Grantslast 30 patents

Method for inspecting pattern defects

Multi-function overlay marks for reducing noise and extracting focu...

Multi-function overlay marks for reducing noise and extracting focu...

Methods of defect inspection

Multi-function overlay marks for reducing noise and extracting focu...

Touch display panel

Multi-function overlay marks for reducing noise and extracting focu...

Methods of defect inspection

Method of determining critical-dimension-related properties, inspec...

Metrology method and apparatus, substrates for use in such methods,...

Metrology method and apparatus

Manufacturing method of pixel structure with data line, scan line a...

Display panel

Measurement of overlay offset in semiconductor processing

Pixel structure with data line, scan line and gate electrode formed...

Extraction of systematic defects

Display panel

Method of defining an intensity selective exposure photomask

System and method for alignment in semiconductor device fabrication

Panel and method for fabricating the same

Array substrate structure of display panel and method of making the...

Detecting method for forming semiconductor device

Intensity selective exposure photomask

Intensity selective exposure photomask

Display panel with driving circuit and common electrode within sealant

Measurement of overlay offset in semiconductor processing

Display panel with driving circuit and common electrode within seal...

Intensity selective exposure method and apparatus

Measurement of overlay offset in semiconductor processing

Mask haze early detection

Patents Applicationslast 30 patents

METHOD FOR INSPECTING PATTERN DEFECTS

Multi-Function Overlay Marks for Reducing Noise and Extracting Focu...

Multi-Function Overlay Marks for Reducing Noise and Extracting Focu...

METHOD FOR INSPECTING PATTERN DEFECTS

Multi-Function Overlay Marks for Reducing Noise and Extracting Focu...

METHODS OF DEFECT INSPECTION

TOUCH DISPLAY PANEL

MULTI-FUNCTION OVERLAY MARKS FOR REDUCING NOISE AND EXTRACTING FOCU...

METHODS OF DEFECT INSPECTION

METROLOGY METHOD AND APPARATUS, SUBSTRATES FOR USE IN SUCH METHODS,...

DISPLAY PANEL

METROLOGY METHOD AND APPARATUS

METHOD OF DETERMINING CRITICAL-DIMENSION-RELATED PROPERTIES, INSPEC...

PIXEL STRUCTURE AND MANUFACTURING METHOD THEREOF

DISPLAY PANEL

METHOD OF DEFINING AN INTENSITY SELECTIVE EXPOSURE PHOTOMASK

SYSTEM AND METHOD FOR ALIGNMENT IN SEMICONDUCTOR DEVICE FABRICATION

DETECTING METHOD FOR FORMING SEMICONDUCTOR DEVICE

ARRAY SUBSTRATE STRUCTURE OF DISPLAY PANEL AND METHOD OF MAKING THE...

Panel and method for fabricating the same

PIXEL STRUCTURE AND MANUFACTURING METHOD THEREOF

EXTRACTION OF SYSTEMATIC DEFECTS

APPARATUS AND METHOD FOR ELIMINATING GLARE

DISPLAY PANEL

INTENSITY SELECTIVE EXPOSURE PHOTOMASK

INTENSITY SELECTIVE EXPOSURE PHOTOMASK

Measurement Of Overlay Offset In Semiconductor Processing

Intensity Selective Exposure Method And Apparatus

PIXEL ARRAY AND MANUFACTURING METHOD THEREOF

DISPLAY PANEL AND MANUFACTURING METHOD THEREOF