Te-Yu CHEN

Person

  • San Jose, CA, US

Patents Grantslast 30 patents

  • Information Patent Grant

    Particle beam inspection apparatus

    • Patent number 11,942,340
    • Issue date Mar 26, 2024
    • ASML Netherlands B.V.
    • Jeroen Gerard Gosen
    • H01 - BASIC ELECTRIC ELEMENTS
  • Information Patent Grant

    Particle beam inspection apparatus

    • Patent number 11,430,678
    • Issue date Aug 30, 2022
    • ASML Netherlands B.V.
    • Jeroen Gerard Gosen
    • H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents