TREA

Tea H. Nim

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  • Orange, CA, US
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Patents Grantslast 30 patents

Patents Applicationslast 30 patents

  • Information Patent Application

    HYBRID PROBE FOR TESTING SEMICONDUCTOR DEVICES
    • Publication number 20080252310
    • Publication date Oct 16, 2008
    • TOUCHDOWN TECHNOLOGIES, INC.
    • Nim Tea
    • G01 - MEASURING TESTING
  • Information Patent Application

    PROBE FOR TESTING SEMICONDUCTOR DEVICES
    • Publication number 20080252328
    • Publication date Oct 16, 2008
    • TOUCHDOWN TECHNOLOGIES, INC.
    • Zhiyong An
    • G01 - MEASURING TESTING
  • Information Patent Application

    Probe card assembly and method of forming same
    • Publication number 20080211525
    • Publication date Sep 4, 2008
    • TOUCHDOWN TECHNOLOGIES, INC.
    • Raffi Garabedian
    • G01 - MEASURING TESTING
  • Information Patent Application

    Torsion spring probe contactor design
    • Publication number 20080106289
    • Publication date May 8, 2008
    • TOUCHDOWN TECHNOLOGIES, INC.
    • Melvin Khoo
    • G01 - MEASURING TESTING
  • Information Patent Application

    Probe Card with Balanced Lateral Force
    • Publication number 20080012594
    • Publication date Jan 17, 2008
    • Shaoning Lu
    • G01 - MEASURING TESTING
  • Information Patent Application

    Method of forming probe card assembly
    • Publication number 20080007281
    • Publication date Jan 10, 2008
    • TOUCHDOWN TECHNOLOGIES, INC.
    • Raffi Garabedian
    • G01 - MEASURING TESTING
  • Information Patent Application

    Stacked Contact Bump
    • Publication number 20070279077
    • Publication date Dec 6, 2007
    • TOUCHDOWN TECHNOLOGIES, INC.
    • Richard Yabuki
    • G01 - MEASURING TESTING
  • Information Patent Application

    Post and tip design for a probe contact
    • Publication number 20070240306
    • Publication date Oct 18, 2007
    • TOUCHDOWN TECHNOLOGIES., INC.
    • Salleh Ismail
    • G01 - MEASURING TESTING
  • Information Patent Application

    STACKED CONTACT BUMP
    • Publication number 20070202683
    • Publication date Aug 30, 2007
    • TOUCHDOWN TECHNOLOGIES, INC.
    • Richard Yabuki
    • G01 - MEASURING TESTING
  • Information Patent Application

    Probe card assembly
    • Publication number 20070145988
    • Publication date Jun 28, 2007
    • TOUCHDOWN TECHNOLOGIES, INC.
    • Raffi Garabedian
    • G01 - MEASURING TESTING
  • Information Patent Application

    Lateral interposer contact design and probe card assembly
    • Publication number 20070057685
    • Publication date Mar 15, 2007
    • TOUCHDOWN TECHNOLOGIES, INC.
    • Raffi Garabedian
    • G01 - MEASURING TESTING
  • Information Patent Application

    Post and tip design for a probe contact
    • Publication number 20070024297
    • Publication date Feb 1, 2007
    • TOUCHDOWN TECHNOLOGIES, INC.
    • Salleh Ismail
    • G01 - MEASURING TESTING
  • Information Patent Application

    Torsion spring probe contactor design
    • Publication number 20070024298
    • Publication date Feb 1, 2007
    • TOUCHDOWN TECHNOLOGIES, INC.
    • Melvin Khoo
    • G01 - MEASURING TESTING
  • Information Patent Application

    Process for forming microstructures
    • Publication number 20060134820
    • Publication date Jun 22, 2006
    • TOUCHDOWN TECHNOLOGIES, INC.
    • Weilong Tang
    • B81 - MICRO-STRUCTURAL TECHNOLOGY
  • Information Patent Application

    Process for forming MEMS
    • Publication number 20060134819
    • Publication date Jun 22, 2006
    • Integrated Micromachines, Inc.
    • Weilong Tang
    • B81 - MICRO-STRUCTURAL TECHNOLOGY
  • Information Patent Application

    ETALON POSITIONING USING SOLDER BALLS
    • Publication number 20050134975
    • Publication date Jun 23, 2005
    • Eric J. Zbinden
    • G02 - OPTICS
  • Information Patent Application

    Distributive optical switching control system
    • Publication number 20020176648
    • Publication date Nov 28, 2002
    • Sudharshan Bhat
    • G02 - OPTICS