Teck Seng Eng

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Singapore, SG

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Patents Grantslast 30 patents

Information Patent Grant
Efficient method of retesting integrated circuits
- Patent number 9,684,034
- Issue date Jun 20, 2017
- International Business Machines Corporation
- Teck Seng Eng
- G01 - MEASURING TESTING
Information Patent Grant
Efficient method of retesting integrated circuits
- Patent number 9,625,524
- Issue date Apr 18, 2017
- International Business Machines Corporation
- Teck Seng Eng
- G01 - MEASURING TESTING
Information Patent Grant
Efficient method of retesting integrated circuits
- Patent number 9,494,650
- Issue date Nov 15, 2016
- International Business Machines Corporation
- Teck Seng Eng
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
EFFICIENT METHOD OF RETESTING INTEGRATED CIRCUITS
- Publication number 20160320444
- Publication date Nov 3, 2016
- International Business Machines Corporation
- Teck Seng Eng
- G01 - MEASURING TESTING
Information Patent Application
EFFICIENT METHOD OF RETESTING INTEGRATED CIRCUITS
- Publication number 20150369862
- Publication date Dec 24, 2015
- International Business Machines Corporation
- Teck Seng Eng
- G01 - MEASURING TESTING
Information Patent Application
EFFICIENT METHOD OF RETESTING INTEGRATED CIRCUITS
- Publication number 20140278196
- Publication date Sep 18, 2014
- International Business Machines Corporation
- Teck Seng Eng
- G01 - MEASURING TESTING