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Ted Christopher
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Rochester, NY, US
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last 30 patents
Information
Patent Grant
Finite amplitude distortion-based inhomogeneous pulse echo ultrason...
Patent number
7,811,233
Issue date
Oct 12, 2010
Research Corporation Technologies, Inc.
Ted Christopher
G01 - MEASURING TESTING
Information
Patent Grant
Finite amplitude distortion-based inhomogeneous pulse echo ultrason...
Patent number
7,513,870
Issue date
Apr 7, 2009
Research Corproation Technologies, Inc.
Ted Christopher
G01 - MEASURING TESTING
Information
Patent Grant
Finite amplitude distortion-based inhomogeneous pulse echo ultrason...
Patent number
7,104,956
Issue date
Sep 12, 2006
Research Corporation Technologies, Inc.
Ted Christopher
G01 - MEASURING TESTING
Information
Patent Grant
Finite amplitude distortion-based inhomogeneous pulse echo ultrason...
Patent number
7,004,905
Issue date
Feb 28, 2006
Research Corporation Technologies, Inc.
Ted Christopher
G01 - MEASURING TESTING
Information
Patent Grant
Finite amplitude distortion-based inhomogeneous pulse echo ultrason...
Patent number
6,206,833
Issue date
Mar 27, 2001
Research Corporation Technologiers, Inc.
Ted Christopher
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
FINITE AMPLITUDE DISTORTION-BASED INHOMOGENEOUS PULSE ECHO ULTRASON...
Publication number
20090105591
Publication date
Apr 23, 2009
RESEARCH CORPORATION TECHNOLOGIES, INC.
Ted Christopher
G01 - MEASURING TESTING
Information
Patent Application
Finite amplitude distortion-based inhomogeneous pulse echo ultrason...
Publication number
20060241433
Publication date
Oct 26, 2006
Research Technologies, Inc.
Ted Christopher
G01 - MEASURING TESTING
Information
Patent Application
Finite amplitude distortion-based inhomogeneous pulse echo ultrason...
Publication number
20050033180
Publication date
Feb 10, 2005
RESEARCH CORPORATION TECHNOLOGIES, INC.
Ted Christopher
G01 - MEASURING TESTING
Information
Patent Application
Finite amplitude distortion-based inhomogeneous pulse echo ultrason...
Publication number
20040249280
Publication date
Dec 9, 2004
RESEARCH CORPORATION TECHNOLOGIES, INC.
Ted Christopher
G01 - MEASURING TESTING