Ted Dziura

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San Jose, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Parametric profiling using optical spectroscopic systems
- Patent number 7,826,071
- Issue date Nov 2, 2010
- KLA-Tencor Corporation
- Andrei V. Shchegrov
- G01 - MEASURING TESTING
Information Patent Grant
Parametric profiling using optical spectroscopic systems
- Patent number 7,280,230
- Issue date Oct 9, 2007
- KLA-Tencor Technologies Corporation
- Andrei V. Shchegrov
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Parametric Profiling Using Optical Spectroscopic Systems
- Publication number 20090135416
- Publication date May 28, 2009
- KLA-Tencor Technologies Corporation
- Andrei V. Shchegrov
- G01 - MEASURING TESTING
Information Patent Application
Parametric profiling using optical spectroscopic systems
- Publication number 20040070772
- Publication date Apr 15, 2004
- Andrei V. Shchegrov
- G01 - MEASURING TESTING