Membership
Tour
Register
Log in
Tehmoor M. Dar
Follow
Person
Mesa, AZ, US
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
MEMS parameter identification using modulated waveforms
Patent number
9,475,689
Issue date
Oct 25, 2016
FREESCALE SEMICONDUCTOR, INC.
Raimondo P. Sessego
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
MEMS parameter identification using modulated waveforms
Patent number
9,335,340
Issue date
May 10, 2016
FREESCALE SEMICONDUCTOR, INC.
Raimondo P. Sessego
G01 - MEASURING TESTING
Information
Patent Grant
MCU-based compensation and calibration for MEMS devices
Patent number
9,335,396
Issue date
May 10, 2016
FREESCALE SEMICONDUCTOR, INC.
Bruno Debeurre
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Grant
Compensation and calibration for MEMS devices
Patent number
9,221,679
Issue date
Dec 29, 2015
FREESCALE SEMICONDUCTOR, INC.
Tehmoor M. Dar
B81 - MICRO-STRUCTURAL TECHNOLOGY
Patents Applications
last 30 patents
Information
Patent Application
COMPENSATION AND CALIBRATION OF MULTIPLE MASS MEMS SENSOR
Publication number
20170067932
Publication date
Mar 9, 2017
FREESCALE SEMICONDUCTOR, INC.
TEHMOOR M. DAR
G01 - MEASURING TESTING
Information
Patent Application
COMPENSATION AND CALIBRATION FOR MEMS DEVICES
Publication number
20160167961
Publication date
Jun 16, 2016
FREESCALE SEMICONDUCTOR, INC.
Tehmoor M. Dar
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
MEMS PARAMETER IDENTIFICATION USING MODULATED WAVEFORMS
Publication number
20160152464
Publication date
Jun 2, 2016
FREESCALE SEMICONDUCTOR, INC.
RAIMONDO P. SESSEGO
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
MEMS PARAMETER IDENTIFICATION USING MODULATED WAVEFORMS
Publication number
20150027198
Publication date
Jan 29, 2015
FREESCALE SEMICONDUCTOR, INC.
Raimondo P. Sessego
G01 - MEASURING TESTING
Information
Patent Application
COMPENSATION AND CALIBRATION FOR MEMS DEVICES
Publication number
20140260508
Publication date
Sep 18, 2014
FREESCALE SEMICONDUCTOR, INC.
Tehmoor M. Dar
B81 - MICRO-STRUCTURAL TECHNOLOGY
Information
Patent Application
MCU-BASED COMPENSATION AND CALIBRATION FOR MEMS DEVICES
Publication number
20140266246
Publication date
Sep 18, 2014
FREESCALE SEMICONDUCTOR, INC.
Bruno Debeurre
B81 - MICRO-STRUCTURAL TECHNOLOGY