Teis Johan COENEN

Person

Veldhoven, NL

People

Patents Grantslast 30 patents

Information Patent Grant
Metrology measurement method and apparatus
- Patent number 12,140,875
- Issue date Nov 12, 2024
- ASML Netherlands B.V.
- Ilse Van Weperen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Particle beam apparatus, defect repair method, lithographic exposur...
- Patent number 11,996,267
- Issue date May 28, 2024
- ASML Netherlands B.V.
- Ruben Cornelis Maas
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and apparatus for determining a radiation beam intensity pro...
- Patent number 11,353,796
- Issue date Jun 7, 2022
- ASML Netherlands B.V.
- Teis Johan Coenen
- G21 - NUCLEAR PHYSICS NUCLEAR ENGINEERING
Information Patent Grant
Methods and apparatus for metrology
- Patent number 10,996,568
- Issue date May 4, 2021
- ASML Netherlands B.V.
- Petrus Wilhelmus Smorenburg
- G01 - MEASURING TESTING
Information Patent Grant
Determining an edge roughness parameter of a periodic structure
- Patent number 10,725,387
- Issue date Jul 28, 2020
- ASML Netherlands B.V.
- Teis Johan Coenen
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Metrology apparatus for and a method of determining a characteristi...
- Patent number 10,670,974
- Issue date Jun 2, 2020
- ASML Netherlands B.V.
- Gerrit Jacobus Hendrik Brussaard
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Grant
Electron injector and free electron laser
- Patent number 10,103,508
- Issue date Oct 16, 2018
- ASML Netherlands B.V.
- Andrey Alexandrovich Nikipelov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Radiation source
- Patent number 9,853,412
- Issue date Dec 26, 2017
- ASML Netherlands B.V.
- Andrey Alexandrovich Nikipelov
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Electron injector and free electron laser
- Patent number 9,728,931
- Issue date Aug 8, 2017
- ASML Netherlands B.V.
- Andrey Alexandrovich Nikipelov
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND APPARATUS FOR FORMING A PATTERNED LAYER OF MATERIAL
- Publication number 20230350301
- Publication date Nov 2, 2023
- ASML NETHERLANDS B.V.
- Evgenia KURGANOVA
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METROLOGY MEASUREMENT METHOD AND APPARATUS
- Publication number 20230100123
- Publication date Mar 30, 2023
- ASML NETHERLANDS B.V.
- Ilse VAN WEPEREN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD FOR CORRECTING MEASUREMENTS IN THE MANUFACTURE OF INTEGRATED...
- Publication number 20230040124
- Publication date Feb 9, 2023
- ASML NETHERLANDS B.V.
- Han-Kwang NIENHUYS
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
METHOD AND APPARATUS FOR FORMING A PATTERNED LAYER OF MATERIAL
- Publication number 20220213593
- Publication date Jul 7, 2022
- ASML NETHERLANDS B.V.
- Tamara DRUZHININA
- C23 - COATING METALLIC MATERIAL COATING MATERIAL WITH METALLIC MATERIAL CHEMI...
Information Patent Application
PARTICLE BEAM APPARATUS, DEFECT REPAIR METHOD, LITHOGRAPHIC EXPOSUR...
- Publication number 20210327678
- Publication date Oct 21, 2021
- ASML NETHERLANDS B.V.
- Ruben Cornelis MAAS
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Methods and Apparatus for Metrology
- Publication number 20200201192
- Publication date Jun 25, 2020
- ASML NETHERLANDS B.V.
- Petrus Wilhelmus SMORENBURG
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Method and Apparatus for Determining a Radiation Beam Intensity Pro...
- Publication number 20200098486
- Publication date Mar 26, 2020
- ASML NETHERLANDS B.V.
- Teis Johan COENEN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Metrology Apparatus for and a Method of Determining a Characteristi...
- Publication number 20190204757
- Publication date Jul 4, 2019
- ASML NETHERLANDS B.V.
- Gerrit Jacobus Hendrik BRUSSAARD
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
DETERMINING AN EDGE ROUGHNESS PARAMETER OF A PERIODIC STRUCTURE
- Publication number 20190025706
- Publication date Jan 24, 2019
- ASML NETHERLANDS B.V.
- Teis Johan COENEN
- G03 - PHOTOGRAPHY CINEMATOGRAPHY ELECTROGRAPHY HOLOGRAPHY
Information Patent Application
Electron Injector and Free Electron Laser
- Publication number 20170264071
- Publication date Sep 14, 2017
- ASML NETHERLANDS B.V.
- Andrey Alexandrovich NIKIPELOV
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
RADIATION SOURCE
- Publication number 20170237225
- Publication date Aug 17, 2017
- ASML NETHERLANDS B.V.
- Andrey Alexandrovich NIKIPELOV
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ELECTRON INJECTOR AND FREE ELECTRON LASER
- Publication number 20160301180
- Publication date Oct 13, 2016
- ASML NETHERLANDS B.V.
- Andrey Alexandrovich NIKIPELOV
- H01 - BASIC ELECTRIC ELEMENTS

Teis Johan COENEN

Person

Patents Grantslast 30 patents

Metrology measurement method and apparatus

Particle beam apparatus, defect repair method, lithographic exposur...

Method and apparatus for determining a radiation beam intensity pro...

Methods and apparatus for metrology

Determining an edge roughness parameter of a periodic structure

Metrology apparatus for and a method of determining a characteristi...

Electron injector and free electron laser

Radiation source

Electron injector and free electron laser

Patents Applicationslast 30 patents

METHOD AND APPARATUS FOR FORMING A PATTERNED LAYER OF MATERIAL

METROLOGY MEASUREMENT METHOD AND APPARATUS

METHOD FOR CORRECTING MEASUREMENTS IN THE MANUFACTURE OF INTEGRATED...

METHOD AND APPARATUS FOR FORMING A PATTERNED LAYER OF MATERIAL

PARTICLE BEAM APPARATUS, DEFECT REPAIR METHOD, LITHOGRAPHIC EXPOSUR...

Methods and Apparatus for Metrology

Method and Apparatus for Determining a Radiation Beam Intensity Pro...

Metrology Apparatus for and a Method of Determining a Characteristi...

DETERMINING AN EDGE ROUGHNESS PARAMETER OF A PERIODIC STRUCTURE

Electron Injector and Free Electron Laser

RADIATION SOURCE

ELECTRON INJECTOR AND FREE ELECTRON LASER