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Teng-Hui Lee
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Hsinchu County, TW
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Patents Grants
last 30 patents
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Patent Grant
Brightness calibration method used in optical detection system with...
Patent number
9,891,097
Issue date
Feb 13, 2018
Global Unichip Corporation
Chang-Ming Liu
G01 - MEASURING TESTING
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Patent Grant
Electronic test system and associated method
Patent number
8,816,708
Issue date
Aug 26, 2014
Global Unichip Corporation
Shin-Cheng Chu
G01 - MEASURING TESTING
Patents Applications
last 30 patents
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Patent Application
BRIGHTNESS CALIBRATION METHOD AND OPTICAL DETECTION SYSTEM
Publication number
20160377477
Publication date
Dec 29, 2016
Global Unichip Corporation
Chang-Ming LIU
G01 - MEASURING TESTING
Information
Patent Application
ELECTRONIC TEST SYSTEM AND ASSOCIATED METHOD
Publication number
20130113508
Publication date
May 9, 2013
Taiwan Semiconductor Manufacturing Co., LTD
Shin-Cheng Chu
G01 - MEASURING TESTING