Teng Lin

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Beijing, CN

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Patents Grantslast 30 patents

Information Patent Grant
Modifying a scan chain for improved fault diagnosis of integrated c...
- Patent number 9,562,945
- Issue date Feb 7, 2017
- International Business Machines Corporation
- Liang Chen
- G01 - MEASURING TESTING
Information Patent Grant
Method of diagnosable scan chain
- Patent number 9,383,409
- Issue date Jul 5, 2016
- International Business Machines Corporation
- Liang Chen
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
MODIFYING A SCAN CHAIN FOR IMPROVED FAULT DIAGNOSIS OF INTEGRATED C...
- Publication number 20160223611
- Publication date Aug 4, 2016
- International Business Machines Corporation
- Liang Chen
- G01 - MEASURING TESTING
Information Patent Application
Method of Diagnosable Scan Chain
- Publication number 20130297980
- Publication date Nov 7, 2013
- International Business Machines Corporation
- Liang Chen
- G01 - MEASURING TESTING