Teng SHI

Follow

Person

Hefei City, Anhui, CN

People

Patents Grantslast 30 patents

Information Patent Grant
Method for checking DFT circuit, test platform, storage medium and...
- Patent number 12,174,250
- Issue date Dec 24, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Teng Shi
- G01 - MEASURING TESTING
Information Patent Grant
Method for testing a command, an apparatus for testing a command an...
- Patent number 11,977,465
- Issue date May 7, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Yu Li
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Method and apparatus for testing adjustment circuit
- Patent number 11,978,498
- Issue date May 7, 2024
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Yu Li
- G11 - INFORMATION STORAGE

Patents Applicationslast 30 patents

Information Patent Application
ADDRESS REFRESH CHECK METHOD AND APPARATUS, STORAGE MEDIUM, AND ELE...
- Publication number 20240055038
- Publication date Feb 15, 2024
- Changxin Memory Technologies, Inc.
- Teng SHI
- G11 - INFORMATION STORAGE
Information Patent Application
MEMORY CHIP TEST METHOD AND APPARATUS, MEDIUM, AND DEVICE
- Publication number 20230410929
- Publication date Dec 21, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Beiyou ZHAO
- G11 - INFORMATION STORAGE
Information Patent Application
METHOD AND APPARATUS FOR TESTING COMMAND, TEST PLATFORM, AND READAB...
- Publication number 20230385169
- Publication date Nov 30, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Yu LI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD FOR CHECKING DFT CIRCUIT, TEST PLATFORM, STORAGE MEDIUM AND...
- Publication number 20230358805
- Publication date Nov 9, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Teng SHI
- G01 - MEASURING TESTING
Information Patent Application
METHOD OF CIRCUIT SIMULATION, TEST APPARATUS, ELECTRONIC DEVICE, AN...
- Publication number 20230342527
- Publication date Oct 26, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC
- Yu LI
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
METHOD AND APPARATUS FOR TESTING ADJUSTMENT CIRCUIT
- Publication number 20230317137
- Publication date Oct 5, 2023
- CHANGXIN MEMORY TECHNOLOGIES, INC.
- Yu LI
- G11 - INFORMATION STORAGE