Tenlin S. Tsai

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Mountain View, CA, US

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Patents Applicationslast 30 patents

Information Patent Application
Particle analysis as a detection system for particle-enhanced assays
- Publication number 20030013083
- Publication date Jan 16, 2003
- Tenlin S. Tsai
- G01 - MEASURING TESTING
Information Patent Application
Enhancing sensitivity and equimolar detection through modifications...
- Publication number 20030003503
- Publication date Jan 2, 2003
- Tenlin S. Tsai
- G01 - MEASURING TESTING