Teodor Gotszalk

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Wroclaw, PL

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Patents Grantslast 30 patents

Information Patent Grant
Apparatus and method for investigating surface properties of differ...
- Patent number 8,689,359
- Issue date Apr 1, 2014
- Nano Analytik GmbH
- Ivo W. Rangelow
- G01 - MEASURING TESTING
Information Patent Grant
Nanoprobe tip for advanced scanning probe microscopy comprising a l...
- Patent number 8,056,402
- Issue date Nov 15, 2011
- Advanced Micro Devices, Inc.
- Michael Hecker
- B82 - NANO-TECHNOLOGY

Patents Applicationslast 30 patents

Information Patent Application
APPARATUS AND METHOD FOR INVESTIGATING SURFACE PROPERTIES OF DIFFER...
- Publication number 20110047662
- Publication date Feb 24, 2011
- Ivo W. Rangelow
- G01 - MEASURING TESTING