Membership
Tour
Register
Log in
Terence Lawrence Kane
Follow
Person
Wappingers Falls, NY, US
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Time temperature monitoring system
Patent number
10,504,807
Issue date
Dec 10, 2019
International Business Machines Corporation
Taryn J. Davis
G01 - MEASURING TESTING
Information
Patent Grant
Time temperature monitoring system
Patent number
10,217,682
Issue date
Feb 26, 2019
International Business Machines Corporation
Taryn J. Davis
G01 - MEASURING TESTING
Information
Patent Grant
Time temperature monitoring system
Patent number
10,032,683
Issue date
Jul 24, 2018
International Business Machines Corporation
Taryn J. Davis
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Apparatus and method for atomic force probing/SEM nano-probing/scan...
Patent number
9,470,712
Issue date
Oct 18, 2016
GLOBALFOUNDRIES Inc.
Terence L. Kane
B65 - CONVEYING PACKING STORING HANDLING THIN OR FILAMENTARY MATERIAL
Information
Patent Grant
Atom probe tomography sample preparation for three-dimensional (3D)...
Patent number
9,279,849
Issue date
Mar 8, 2016
International Business Machines Corporation
Terence L. Kane
G01 - MEASURING TESTING
Information
Patent Grant
Atom probe tomography sample preparation for three-dimensional (3D)...
Patent number
9,201,112
Issue date
Dec 1, 2015
International Business Machines Corporation
Terence L. Kane
G01 - MEASURING TESTING
Information
Patent Grant
High frequency capacitance-voltage nanoprobing characterization
Patent number
9,170,273
Issue date
Oct 27, 2015
GlobalFoundries U.S. 2 LLC
Terence L. Kane
G01 - MEASURING TESTING
Information
Patent Grant
Inert gas delivery system for electrical inspection apparatus
Patent number
9,052,338
Issue date
Jun 9, 2015
International Business Machines Corporation
Terence Lawrence Kane
G01 - MEASURING TESTING
Information
Patent Grant
Inert gas delivery system for electrical inspection apparatus
Patent number
8,701,511
Issue date
Apr 22, 2014
International Business Machines Corporation
Richard Walter Oldrey
G01 - MEASURING TESTING
Information
Patent Grant
Voltage sensitive resistor (VSR) read only memory
Patent number
8,536,555
Issue date
Sep 17, 2013
International Business Machines Corporation
Terence L. Kane
G11 - INFORMATION STORAGE
Information
Patent Grant
Method of fabricating a device using low temperature anneal process...
Patent number
8,490,029
Issue date
Jul 16, 2013
International Business Machines Corporation
Anthony G. Domenicucci
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Voltage sensitive resistor (VSR) read only memory
Patent number
8,466,443
Issue date
Jun 18, 2013
International Business Machines Corporation
Terence L. Kane
G11 - INFORMATION STORAGE
Information
Patent Grant
Antifuse structure for in line circuit modification
Patent number
8,367,483
Issue date
Feb 5, 2013
International Business Machines Corporation
Terence L. Kane
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Antifuse structure for in line circuit modification
Patent number
8,368,070
Issue date
Feb 5, 2013
International Business Machines Corporation
Terence L. Kane
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Antifuse structure for in line circuit modification
Patent number
8,368,069
Issue date
Feb 5, 2013
International Business Machines Corporation
Terence L. Kane
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Antifuse structure for in line circuit modification
Patent number
8,367,484
Issue date
Feb 5, 2013
International Business Machines Corporation
Terence L. Kane
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of fabricating a device using low temperature anneal process...
Patent number
8,236,709
Issue date
Aug 7, 2012
International Business Machines Corporation
Anthony G. Domenicucci
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Antifuse structure for in line circuit modification
Patent number
8,125,048
Issue date
Feb 28, 2012
International Business Machines Corporation
Terence L. Kane
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Backside unlayering of MOSFET devices for electrical and physical c...
Patent number
7,993,504
Issue date
Aug 9, 2011
International Business Machines Corporation
Terence L Kane
G01 - MEASURING TESTING
Information
Patent Grant
Programmable precision resistor and method of programming the same
Patent number
7,881,093
Issue date
Feb 1, 2011
International Business Machines Corporation
Anthony G. Domenicucci
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Backside unlayering of MOSFET devices for electrical and physical c...
Patent number
7,371,689
Issue date
May 13, 2008
International Business Machines Corporation
Terence L Kane
G01 - MEASURING TESTING
Information
Patent Grant
Apparatus and method for selected site backside unlayering of si, G...
Patent number
7,205,237
Issue date
Apr 17, 2007
International Business Machines Corporation
Andrew Deering
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method of processing backside unlayering of MOSFET devices for elec...
Patent number
7,015,146
Issue date
Mar 21, 2006
International Business Machines Corporation
Terence L. Kane
G01 - MEASURING TESTING
Information
Patent Grant
Method of reworking structures incorporating low-k dielectric mater...
Patent number
7,008,803
Issue date
Mar 7, 2006
International Business Machines Corporation
Terence Lawrence Kane
G01 - MEASURING TESTING
Information
Patent Grant
Bilayer HDP CVD/PE CVD cap in advanced BEOL interconnect structures...
Patent number
6,914,320
Issue date
Jul 5, 2005
International Business Machines Corporation
Tze-Chiang Chen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Specific site backside underlaying and micromasking method for elec...
Patent number
6,894,522
Issue date
May 17, 2005
International Business Machines Corporation
Barbara A. Averill
G01 - MEASURING TESTING
Information
Patent Grant
Methods and systems for fabricating electrical connections to semic...
Patent number
6,888,224
Issue date
May 3, 2005
International Business Machines Corporation
Terence Lawrence Kane
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Bilayer HDP CVD/PE CVD cap in advance BEOL interconnect structures...
Patent number
6,887,783
Issue date
May 3, 2005
International Business Machines Corporation
Tze-Chiang Chen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Site-specific methodology for localization and analyzing junction d...
Patent number
6,884,641
Issue date
Apr 26, 2005
International Business Machines Corporation
John Bruley
G01 - MEASURING TESTING
Information
Patent Grant
Method for electrically characterizing charge sensitive semiconduct...
Patent number
6,858,530
Issue date
Feb 22, 2005
International Business Machines Corporation
Terence Kane
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
TIME TEMPERATURE MONITORING SYSTEM
Publication number
20180350702
Publication date
Dec 6, 2018
International Business Machines Corporation
Taryn J. Davis
G01 - MEASURING TESTING
Information
Patent Application
TIME TEMPERATURE MONITORING SYSTEM
Publication number
20180226308
Publication date
Aug 9, 2018
International Business Machines Corporation
Taryn J. Davis
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
TIME TEMPERATURE MONITORING SYSTEM
Publication number
20160372391
Publication date
Dec 22, 2016
International Business Machines Corporation
Taryn J. Davis
G01 - MEASURING TESTING
Information
Patent Application
DEVICE STRUCTURE WITH NEGATIVE RESISTANCE CHARACTERISTICS
Publication number
20160225919
Publication date
Aug 4, 2016
GLOBALFOUNDRIES INC.
Fen Chen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
LOW ENERGY COLLIMATED ION MILLING OF SEMICONDUCTOR STRUCTURES
Publication number
20160035633
Publication date
Feb 4, 2016
International Business Machines Corporation
TERENCE L. KANE
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ATOM PROBE TOMOGRAPHY SAMPLE PREPARATION FOR THREE-DIMENSIONAL (3D)...
Publication number
20150355266
Publication date
Dec 10, 2015
International Business Machines Corporation
Terence L. Kane
G01 - MEASURING TESTING
Information
Patent Application
ATOM PROBE TOMOGRAPHY SAMPLE PREPARATION FOR THREE-DIMENSIONAL (3D)...
Publication number
20150160286
Publication date
Jun 11, 2015
International Business Machines Corporation
Terence L. Kane
G01 - MEASURING TESTING
Information
Patent Application
HIGH FREQUENCY CAPACITANCE-VOLTAGE NANOPROBING CHARACTERIZATION
Publication number
20150160261
Publication date
Jun 11, 2015
International Business Machines Corporation
Terence L. Kane
G01 - MEASURING TESTING
Information
Patent Application
SELECTIVE PASSIVATION OF VIAS
Publication number
20150076695
Publication date
Mar 19, 2015
STMicroelectronics, Inc.
Tien-Jen Cheng
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
LOW ENERGY COLLIMATED ION MILLING OF SEMICONDUCTOR STRUCTURES
Publication number
20140295584
Publication date
Oct 2, 2014
International Business Machines Corporation
Terence L. Kane
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
INERT GAS DELIVERY SYSTEM FOR ELECTRICAL INSPECTION APPARATUS
Publication number
20140069165
Publication date
Mar 13, 2014
Terence Lawrence Kane
G02 - OPTICS
Information
Patent Application
VOLTAGE SENSITIVE RESISTOR (VSR) READ ONLY MEMORY
Publication number
20130189824
Publication date
Jul 25, 2013
International Business Machines Corporation
Terence L. Kane
G11 - INFORMATION STORAGE
Information
Patent Application
INERT GAS DELIVERY SYSTEM FOR ELECTRICAL INSPECTION APPARATUS
Publication number
20120240657
Publication date
Sep 27, 2012
International Business Machines Corporation
Richard Walter Oldrey
G02 - OPTICS
Information
Patent Application
METHOD OF FABRICATING A DEVICE USING LOW TEMPERATURE ANNEAL PROCESS...
Publication number
20120180010
Publication date
Jul 12, 2012
International Business Machines Corporation
Anthony G. DOMENICUCCI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ANTIFUSE STRUCTURE FOR IN LINE CIRCUIT MODIFICATION
Publication number
20120126366
Publication date
May 24, 2012
International Business Machines Corporation
Terence L. Kane
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ANTIFUSE STRUCTURE FOR IN LINE CIRCUIT MODIFICATION
Publication number
20120129340
Publication date
May 24, 2012
International Business Machines Corporation
Terence L. Kane
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ANTIFUSE STRUCTURE FOR IN LINE CIRCUIT MODIFICATION
Publication number
20120126367
Publication date
May 24, 2012
International Business Machines Corporation
Terence L. Kane
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
ANTIFUSE STRUCTURE FOR IN LINE CIRCUIT MODIFICATION
Publication number
20120122280
Publication date
May 17, 2012
International Business Machines Corporation
Terence L. Kane
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
VOLTAGE SENSITIVE RESISTOR (VSR) READ ONLY MEMORY
Publication number
20120001140
Publication date
Jan 5, 2012
International Business Machines Corporation
Terence L. Kane
G11 - INFORMATION STORAGE
Information
Patent Application
ANTIFUSE STRUCTURE FOR IN LINE CIRCUIT MODIFICATION
Publication number
20110079874
Publication date
Apr 7, 2011
International Business Machines Corporation
Terence L. Kane
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method of Fabricating a Device Using Low Temperature Anneal Process...
Publication number
20110027956
Publication date
Feb 3, 2011
International Business Machines Corporation
Anthony G. DOMENICUCCI
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
PROGRAMMABLE PRECISION RESISTOR AND METHOD OF PROGRAMMING THE SAME
Publication number
20100025819
Publication date
Feb 4, 2010
International Business Machines Corporation
Anthony G. Domenicucci
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
BACKSIDE UNLAYERING OF MOSFET DEVICES FOR ELECTRICAL AND PHYSICAL C...
Publication number
20080128086
Publication date
Jun 5, 2008
International Business Machines Corporation
Terence L. Kane
G01 - MEASURING TESTING
Information
Patent Application
APPARATUS AND METHOD FOR SELECTED SITE BACKSIDE UNLAYERING OF SILIC...
Publication number
20070010097
Publication date
Jan 11, 2007
International Business Machines Corporation
Andrew Deering
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Backside unlayering of MOSFET devices for electrical and physical c...
Publication number
20060030160
Publication date
Feb 9, 2006
IBM CORPORATION
Terence L. Kane
G01 - MEASURING TESTING
Information
Patent Application
Method of reworking structures incorporating low-k dielectric mater...
Publication number
20050285106
Publication date
Dec 29, 2005
International Business Machines Corporation
Terence Lawrence Kane
G01 - MEASURING TESTING
Information
Patent Application
Backside unlayering of MOSFET devices for electrical and physical c...
Publication number
20050148157
Publication date
Jul 7, 2005
Terence L. Kane
G01 - MEASURING TESTING
Information
Patent Application
SPECIFIC SITE BACKSIDE UNDERLAYING AND MICROMASKING METHOD FOR ELEC...
Publication number
20050073333
Publication date
Apr 7, 2005
International Business Machines Corporation
Barbara A. Averill
G01 - MEASURING TESTING
Information
Patent Application
SITE-SPECIFIC METHODOLOGY FOR LOCALIZATION AND ANALYZING JUNCTION D...
Publication number
20050064610
Publication date
Mar 24, 2005
International Business Machines Corporation
JOHN BRULEY
G01 - MEASURING TESTING
Information
Patent Application
Bilayer HDP CVD / PE CVD cap in advanced BEOL interconnect structur...
Publication number
20040173907
Publication date
Sep 9, 2004
Tze-Chiang Chen
H01 - BASIC ELECTRIC ELEMENTS