Teresa L. Pinto

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Wallkill, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Evaluating semiconductor wafers for pitch walking and/or epitaxial...
- Patent number 9,201,027
- Issue date Dec 1, 2015
- GLOBALFOUNDRIES Inc.
- Kriteshwar K. Kohli
- G01 - MEASURING TESTING
Information Patent Grant
Measurement of CMOS device channel strain by X-ray diffraction
- Patent number 8,716,037
- Issue date May 6, 2014
- International Business Machines Corporation
- Thomas N. Adam
- G01 - MEASURING TESTING
Information Patent Grant
Measuring strain of epitaxial films using micro x-ray diffraction f...
- Patent number 7,769,134
- Issue date Aug 3, 2010
- International Business Machines Corporation
- Thomas N. Adam
- G01 - MEASURING TESTING
Information Patent Grant
Weighted sintering process and conformable load tile
- Patent number 5,874,162
- Issue date Feb 23, 1999
- International Business Machines Corporation
- Kurt E. Bastian
- C04 - CEMENTS CONCRETE ARTIFICIAL STONE CERAMICS REFRACTORIES

Patents Applicationslast 30 patents

Information Patent Application
EVALUATING SEMICONDUCTOR WAFERS FOR PITCH WALKING AND/OR EPITAXIAL...
- Publication number 20150233844
- Publication date Aug 20, 2015
- International Business Machines Corporation
- Kriteshwar K. Kohli
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT OF CMOS DEVICE CHANNEL STRAIN BY X-RAY DIFFRACTION
- Publication number 20140159161
- Publication date Jun 12, 2014
- International Business Machines Corporation
- Thomas N. Adam
- G01 - MEASURING TESTING
Information Patent Application
MEASUREMENT OF CMOS DEVICE CHANNEL STRAIN BY X-RAY DIFFRACTION
- Publication number 20120146050
- Publication date Jun 14, 2012
- International Business Machines Corporation
- THOMAS N. ADAM
- G01 - MEASURING TESTING
Information Patent Application
MEASURING STRAIN OF EPITAXIAL FILMS USING MICRO X-RAY DIFFRACTION F...
- Publication number 20100208869
- Publication date Aug 19, 2010
- International Business Machines Corporation
- Thomas N. Adam
- G01 - MEASURING TESTING