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Teresa Louise McLaurin
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Dripping Springs, TX, US
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Patents Grants
last 30 patents
Information
Patent Grant
Latch circuitry for memory applications
Patent number
11,568,926
Issue date
Jan 31, 2023
ARM Limited
Andy Wangkun Chen
G11 - INFORMATION STORAGE
Information
Patent Grant
Latch circuitry for memory applications
Patent number
10,847,211
Issue date
Nov 24, 2020
ARM Limited
Andy Wangkun Chen
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Scan cell for dual port memory applications
Patent number
10,222,418
Issue date
Mar 5, 2019
ARM Limited
Yew Keong Chong
G11 - INFORMATION STORAGE
Information
Patent Grant
Partial scan cell
Patent number
9,612,280
Issue date
Apr 4, 2017
ARM Limited
Teresa Louise McLaurin
G01 - MEASURING TESTING
Information
Patent Grant
Integrated circuit testing
Patent number
8,468,405
Issue date
Jun 18, 2013
ARM Limited
Teresa Louise McLaurin
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Scan chain cell with delay testing capability
Patent number
7,913,131
Issue date
Mar 22, 2011
ARM Limited
Teresa Louise McLaurin
G01 - MEASURING TESTING
Information
Patent Grant
Wrapper serial scan chain functional segmentation
Patent number
7,308,631
Issue date
Dec 11, 2007
ARM Limited
Teresa Louise McLaurin
G01 - MEASURING TESTING
Information
Patent Grant
Validating test signal connections within an integrated circuit
Patent number
7,085,978
Issue date
Aug 1, 2006
ARM Limited
Teresa Louise McLaurin
G01 - MEASURING TESTING
Information
Patent Grant
Resetting latch circuits within a functional circuit and a test wra...
Patent number
7,080,299
Issue date
Jul 18, 2006
ARM Limited
Teresa Louise McLaurin
G01 - MEASURING TESTING
Information
Patent Grant
Testing memory access signal connections
Patent number
6,999,900
Issue date
Feb 14, 2006
ARM Limited
Teresa Louise McLaurin
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
Method and apparatus for testing an integrated circuit
Patent number
6,598,192
Issue date
Jul 22, 2003
Motorola, Inc.
Teresa L. McLaurin
G01 - MEASURING TESTING
Patents Applications
last 30 patents
Information
Patent Application
Latch Circuitry for Memory Applications
Publication number
20210074353
Publication date
Mar 11, 2021
ARM Limited
Andy Wangkun Chen
G11 - INFORMATION STORAGE
Information
Patent Application
Latch Circuitry for Memory Applications
Publication number
20190325947
Publication date
Oct 24, 2019
ARM Limited
Andy Wangkun Chen
G11 - INFORMATION STORAGE
Information
Patent Application
Scan Cell for Dual Port Memory Applications
Publication number
20180156866
Publication date
Jun 7, 2018
ARM Limited
Yew Keong Chong
G01 - MEASURING TESTING
Information
Patent Application
PARTIAL SCAN CELL
Publication number
20150143190
Publication date
May 21, 2015
ARM Limited
Teresa Louise MCLAURIN
G01 - MEASURING TESTING
Information
Patent Application
INTER-DIE CONNECTION WITHIN AN INTEGRATED CIRCUIT FORMED OF A STACK...
Publication number
20130256908
Publication date
Oct 3, 2013
ARM Limited
Teresa Louise Mclaurin
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Integrated circuit testing
Publication number
20120166902
Publication date
Jun 28, 2012
ARM Limited
Teresa Louise McLaurin
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Scan chain cell with delay testing capability
Publication number
20090177935
Publication date
Jul 9, 2009
ARM Limited
Teresa Louise McLaurin
G01 - MEASURING TESTING
Information
Patent Application
Wrapper serial scan chain functional segmentation
Publication number
20050283690
Publication date
Dec 22, 2005
Teresa Louise McLaurin
G01 - MEASURING TESTING
Information
Patent Application
Testing memory access signal connections
Publication number
20050222809
Publication date
Oct 6, 2005
ARM Limited
Teresa Louise McLaurin
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Resetting latch circuits within a functional circuit and a test wra...
Publication number
20040153915
Publication date
Aug 5, 2004
Teresa Louise McLaurin
G01 - MEASURING TESTING
Information
Patent Application
Validating test signal connections within an integrated circuit
Publication number
20040054948
Publication date
Mar 18, 2004
ARM Limited
Teresa Louise McLaurin
G01 - MEASURING TESTING