Teresita Quitua Magtoto

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Poughkeepsie, NY, US

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Patents Grantslast 30 patents

Information Patent Grant
Method and system for line-dimension control of an etch process
- Patent number 7,700,378
- Issue date Apr 20, 2010
- International Business Machines Corporation
- Gary Walter Behm
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method and system for line-dimension control of an etch process
- Patent number 7,291,285
- Issue date Nov 6, 2007
- International Business Machines Corporation
- Gary Walter Behm
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
METHOD AND SYSTEM FOR LINE-DIMENSION CONTROL OF AN ETCH PROCESS
- Publication number 20080032428
- Publication date Feb 7, 2008
- Gary Walter Behm
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
Method and system for line-dimension control of an etch process
- Publication number 20060255010
- Publication date Nov 16, 2006
- International Business Machines Corporation
- Gary Walter Behm
- H01 - BASIC ELECTRIC ELEMENTS