Termsupt Seemuntchaiboworn

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Patents Grantslast 30 patents

Information Patent Grant
Endpointing for focused ion beam processing
- Patent number 10,529,538
- Issue date Jan 7, 2020
- FEI Company
- Scott Edward Fuller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Endpointing for focused ion beam processing
- Patent number 10,204,762
- Issue date Feb 12, 2019
- FEI Company
- Scott Edward Fuller
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
ENDPOINTING FOR FOCUSED ION BEAM PROCESSING
- Publication number 20190172680
- Publication date Jun 6, 2019
- FEI Company
- Scott Edward FULLER
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
ENDPOINTING FOR FOCUSED ION BEAM PROCESSING
- Publication number 20160126060
- Publication date May 5, 2016
- Scott Edward Fuller
- H01 - BASIC ELECTRIC ELEMENTS