Tero Eklin

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Patents Grantslast 30 patents

Information Patent Grant
Method and arrangement for non-destructive composition analysis of...
- Patent number 7,426,019
- Issue date Sep 16, 2008
- Oxford Instruments Analytical Oy
- Tero Eklin
- G01 - MEASURING TESTING
Information Patent Grant
Measurement apparatus and method for determining the material compo...
- Patent number 7,233,643
- Issue date Jun 19, 2007
- Oxford Instruments Analytical Oy
- Heikki Johannes Sipilä
- G01 - MEASURING TESTING
Information Patent Grant
Method and arrangement for applying optical emission spectroscopy t...
- Patent number 6,934,021
- Issue date Aug 23, 2005
- Oxford Instruments Analytical Oy
- Tero Eklin
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Method and arrangement for non-destructive composition analysis of...
- Publication number 20060262302
- Publication date Nov 23, 2006
- Oxford Instruments Analytical Oy.
- Tero Eklin
- G01 - MEASURING TESTING
Information Patent Application
Measurement apparatus and method for determining the material compo...
- Publication number 20060262900
- Publication date Nov 23, 2006
- Oxford Instruments Analytical Oy.
- Heikki Johannes Sipila
- G01 - MEASURING TESTING
Information Patent Application
Method and arrangement for applying optical emission spectroscopy t...
- Publication number 20040160602
- Publication date Aug 19, 2004
- Tero Eklin
- G01 - MEASURING TESTING
Information Patent Application
Method and arrangement for applying optical emission spectroscopy t...
- Publication number 20040051866
- Publication date Mar 18, 2004
- Tero Eklin
- G01 - MEASURING TESTING