Membership
Tour
Register
Log in
Terrance Wayne Kueper
Follow
Person
Rochester, MN, US
People
Overview
Industries
Organizations
People
Information
Impact
Patents Grants
last 30 patents
Information
Patent Grant
Semiconductor scheme for reduced circuit area in a simplified process
Patent number
7,935,629
Issue date
May 3, 2011
International Business Machines Corporation
Todd Alan Christensen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Systems and arrangements to assess thermal performance
Patent number
7,734,444
Issue date
Jun 8, 2010
International Business Machines Corporation
Ronald Xavier Arroyo
G01 - MEASURING TESTING
Information
Patent Grant
FinFET body contact structure
Patent number
7,696,565
Issue date
Apr 13, 2010
International Business Machines Corporation
Richard Lee Donze
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Semiconductor scheme for reduced circuit area in a simplified process
Patent number
7,626,220
Issue date
Dec 1, 2009
International Business Machines Corporation
Todd Alan Christensen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method for correcting for asymmetry of threshold voltage shifts
Patent number
7,541,829
Issue date
Jun 2, 2009
International Business Machines Corporation
Ronald J. Bolam
G01 - MEASURING TESTING
Information
Patent Grant
Systems and arrangements to assess thermal performance
Patent number
7,338,818
Issue date
Mar 4, 2008
International Business Machines Corporation
Ronald Xavier Arroyo
G01 - MEASURING TESTING
Information
Patent Grant
Semiconductor scheme for reduced circuit area in a simplified process
Patent number
7,317,217
Issue date
Jan 8, 2008
International Business Machines Corporation
Todd Alan Christensen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method and apparatus for improving performance margin in logic paths
Patent number
7,317,605
Issue date
Jan 8, 2008
International Business Machines Corporation
Richard Lee Donze
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Grant
FinFET body contact structure
Patent number
7,241,649
Issue date
Jul 10, 2007
International Business Machines Corporation
Richard Lee Donze
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Polysilicon conductor width measurement for 3-dimensional FETs
Patent number
7,227,183
Issue date
Jun 5, 2007
International Business Machines Corporation
Richard Lee Donze
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Grant
Method, apparatus and computer program product for implementing the...
Patent number
7,184,924
Issue date
Feb 27, 2007
International Business Machines Corporation
Peter James Shabino
G01 - MEASURING TESTING
Information
Patent Grant
Method and apparatus to reduce bias temperature instability (BTI) e...
Patent number
7,009,905
Issue date
Mar 7, 2006
International Business Machines Corporation
Anthony Gus Aipperspach
G11 - INFORMATION STORAGE
Information
Patent Grant
Method and testing circuit for tracking transistor stress degradation
Patent number
6,879,177
Issue date
Apr 12, 2005
International Business Machines Corporation
Ronald Jay Bolam
G01 - MEASURING TESTING
Information
Patent Grant
Ring oscillator circuit for EDRAM/DRAM performance monitoring
Patent number
6,774,734
Issue date
Aug 10, 2004
International Business Machines Corporation
Todd Alan Christensen
G11 - INFORMATION STORAGE
Information
Patent Grant
CMOS off-chip driver circuit
Patent number
6,198,316
Issue date
Mar 6, 2001
International Business Machines Corporation
David John Krolak
H03 - BASIC ELECTRONIC CIRCUITRY
Information
Patent Grant
Regulator for substrate voltage generator
Patent number
4,553,047
Issue date
Nov 12, 1985
International Business Machines Corporation
Thomas E. Dillinger
G05 - CONTROLLING REGULATING
Patents Applications
last 30 patents
Information
Patent Application
Systems and Arrangements to Assess Thermal Performance
Publication number
20080112456
Publication date
May 15, 2008
Ronald Xavier Arroyo
G01 - MEASURING TESTING
Information
Patent Application
Semiconductor Scheme for Reduced Circuit Area in a Simplified Process
Publication number
20080102627
Publication date
May 1, 2008
International Business Machines Corporation
Todd Alan Christensen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Semiconductor Scheme for Reduced Circuit Area in a Simplified Process
Publication number
20080093683
Publication date
Apr 24, 2008
International Business Machines Corporation
Todd Alan Christensen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
FinFET Body Contact Structure
Publication number
20070202659
Publication date
Aug 30, 2007
International Business Machines Corporation
Richard Lee Donze
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Polysilicon Conductor Width Measurement for 3-Dimensional FETs
Publication number
20070128740
Publication date
Jun 7, 2007
International Business Machines Corporation
Richard Lee Donze
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Systems and arrangements to assess thermal performance
Publication number
20060263912
Publication date
Nov 23, 2006
Ronald Xavier Arroyo
G01 - MEASURING TESTING
Information
Patent Application
FinFET body contact structure
Publication number
20060091463
Publication date
May 4, 2006
International Business Machines Corporation
Richard Lee Donze
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Semiconductor scheme for reduced circuit area in a simplified process
Publication number
20060060926
Publication date
Mar 23, 2006
International Business Machines Corporation
Todd Alan Christensen
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Polysilicon conductor width measurement for 3-dimensional FETs
Publication number
20060063317
Publication date
Mar 23, 2006
International Business Machines Corporation
Richard Lee Donze
H01 - BASIC ELECTRIC ELEMENTS
Information
Patent Application
Method and apparatus for improving performance margin in logic paths
Publication number
20050201188
Publication date
Sep 15, 2005
International Business Machines Corporation
Richard Lee Donze
G06 - COMPUTING CALCULATING COUNTING
Information
Patent Application
Method and apparatus to reduce bias temperature instability (BTI) e...
Publication number
20050134360
Publication date
Jun 23, 2005
International Business Machines Corporation
Anthony Gus Aipperspach
G11 - INFORMATION STORAGE
Information
Patent Application
RING OSCILLATOR CIRCUIT FOR EDRAM/DRAM PERFORMANCE MONITORING
Publication number
20040100336
Publication date
May 27, 2004
International Business Machines Corporation
Todd Alan Christensen
H03 - BASIC ELECTRONIC CIRCUITRY