Terrence J. Riley

Person

Austin, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Method for adjusting rapid thermal processing (RTP) recipe setpoint...
- Patent number 6,856,849
- Issue date Feb 15, 2005
- Advanced Micro Devices, Inc.
- Terrence J. Riley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Run-to-run control method for proportional-integral-derivative (PID...
- Patent number 6,819,963
- Issue date Nov 16, 2004
- Advanced Micro Devices, Inc.
- Terrence J. Riley
- G05 - CONTROLLING REGULATING
Information Patent Grant
Method and apparatus for using tool state information to identify f...
- Patent number 6,738,731
- Issue date May 18, 2004
- Advanced Micro Devices, Inc.
- Terrence J. Riley
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for fault detection of a processing tool and c...
- Patent number 6,725,402
- Issue date Apr 20, 2004
- Advanced Micro Devices, Inc.
- Elfido Coss
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Method and apparatus for fault model analysis in manufacturing tools
- Patent number 6,697,691
- Issue date Feb 24, 2004
- Advanced Micro Devices, Inc.
- Michael L. Miller
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Wafer-less qualification of a processing tool
- Patent number 6,629,012
- Issue date Sep 30, 2003
- Advanced Micro Devices Inc.
- Terrence J. Riley
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Lot-to-lot rapid thermal processing (RTP) chamber preheat optimization
- Patent number 6,324,341
- Issue date Nov 27, 2001
- Advanced Micro Devices, Inc.
- Terrence J. Riley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Lot-to-lot rapid thermal processing (RTP) chamber preheat optimization
- Patent number 6,268,270
- Issue date Jul 31, 2001
- Advanced Micro Devices, Inc.
- Glen W. Scheid
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Run-to-run control method for proportional-integral-derivative (PID...
- Publication number 20020107604
- Publication date Aug 8, 2002
- Terrence J. Riley
- G05 - CONTROLLING REGULATING
Information Patent Application
Method for adjusting rapid thermal processing (RTP) recipe setpoint...
- Publication number 20020095278
- Publication date Jul 18, 2002
- Terrence J. Riley
- H01 - BASIC ELECTRIC ELEMENTS

Terrence J. Riley

Person

Patents Grantslast 30 patents

Method for adjusting rapid thermal processing (RTP) recipe setpoint...

Run-to-run control method for proportional-integral-derivative (PID...

Method and apparatus for using tool state information to identify f...

Method and apparatus for fault detection of a processing tool and c...

Method and apparatus for fault model analysis in manufacturing tools

Wafer-less qualification of a processing tool

Lot-to-lot rapid thermal processing (RTP) chamber preheat optimization

Lot-to-lot rapid thermal processing (RTP) chamber preheat optimization

Patents Applicationslast 30 patents

Run-to-run control method for proportional-integral-derivative (PID...

Method for adjusting rapid thermal processing (RTP) recipe setpoint...