Terri A. Couteau

Person

Rosansky, TX, US

People

Patents Grantslast 30 patents

Information Patent Grant
Methods of controlling wet chemical processes in forming metal sili...
- Patent number 6,790,683
- Issue date Sep 14, 2004
- Advanced Micro Devices, Inc.
- Richard J. Markle
- G01 - MEASURING TESTING
Information Patent Grant
Method of detecting crystalline defects using sound waves
- Patent number 6,566,886
- Issue date May 20, 2003
- Advanced Micro Devices, Inc.
- Terri A. Couteau
- G01 - MEASURING TESTING
Information Patent Grant
Method and apparatus for detecting ion implant induced defects
- Patent number 6,524,869
- Issue date Feb 25, 2003
- Advanced Micro Devices, Inc.
- Michael J. Satterfield
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Control of transistor performance through adjustment of spacer oxid...
- Patent number 6,492,275
- Issue date Dec 10, 2002
- Advanced Micro Devices, Inc.
- Deborah J. Riley
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
Method of controlling feature dimensions based upon etch chemistry...
- Patent number 6,352,867
- Issue date Mar 5, 2002
- Advanced Micro Devices, Inc.
- Terri A. Couteau
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Grant
System and method for controlling polysilicon feature critical dime...
- Patent number 6,348,289
- Issue date Feb 19, 2002
- Advanced Micro Devices, Inc.
- Terri A. Couteau
- B25 - HAND TOOLS PORTABLE POWER-DRIVEN TOOLS MANIPULATORS
Information Patent Grant
Method and apparatus for partial drain during a nitride strip proce...
- Patent number 6,326,313
- Issue date Dec 4, 2001
- Advanced Micro Devices
- Terri A. Couteau
- H01 - BASIC ELECTRIC ELEMENTS

Patents Applicationslast 30 patents

Information Patent Application
Sacrificial films to provide structural integrity to critical dimen...
- Publication number 20020142594
- Publication date Oct 3, 2002
- Advanced Micro Devices, Inc.
- Terri A. Couteau
- H01 - BASIC ELECTRIC ELEMENTS
Information Patent Application
CONTROL OF TRANSISTOR PERFORMANCE THROUGH ADJUSTMENT OF SPACER OXID...
- Publication number 20020119647
- Publication date Aug 29, 2002
- Deborah J Riley
- H01 - BASIC ELECTRIC ELEMENTS

Terri A. Couteau

Person

Patents Grantslast 30 patents

Methods of controlling wet chemical processes in forming metal sili...

Method of detecting crystalline defects using sound waves

Method and apparatus for detecting ion implant induced defects

Control of transistor performance through adjustment of spacer oxid...

Method of controlling feature dimensions based upon etch chemistry...

System and method for controlling polysilicon feature critical dime...

Method and apparatus for partial drain during a nitride strip proce...

Patents Applicationslast 30 patents

Sacrificial films to provide structural integrity to critical dimen...

CONTROL OF TRANSISTOR PERFORMANCE THROUGH ADJUSTMENT OF SPACER OXID...