Terry Lee Doyle

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Portola Vally, CA, US

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Patents Grantslast 30 patents

Information Patent Grant
Wafer fabrication data acquisition and management systems
- Patent number 6,952,656
- Issue date Oct 4, 2005
- Applied Materials, Inc.
- Sherry Cordova
- G05 - CONTROLLING REGULATING
Information Patent Grant
Apparatus and method for endpoint control and plasma monitoring
- Patent number 6,535,779
- Issue date Mar 18, 2003
- Applied Materials, Inc.
- Manush Birang
- H01 - BASIC ELECTRIC ELEMENTS