Terry Ludlow

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Ottawa, CA

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Patents Grantslast 30 patents

Information Patent Grant
Design analysis workstation for analyzing integrated circuits
- Patent number 7,509,601
- Issue date Mar 24, 2009
- Chipworks Inc.
- David F. Skoll
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Design analysis workstation for analyzing integrated circuits
- Patent number 7,020,853
- Issue date Mar 28, 2006
- Chipworks
- David F. Skoll
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Design analysis workstation for analyzing integrated circuits
- Patent number 6,684,379
- Issue date Jan 27, 2004
- Chipworks
- David F. Skoll
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Grant
Automatic focused ion beam imaging system and method
- Patent number 6,453,063
- Issue date Sep 17, 2002
- Chipworks
- Michael Phaneuf
- G01 - MEASURING TESTING

Patents Applicationslast 30 patents

Information Patent Application
Design analysis workstation for analyzing integrated circuits
- Publication number 20060095884
- Publication date May 4, 2006
- CHIPWORKS
- David F. Skoll
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Design analysis workstation for analyzing integrated circuits
- Publication number 20040117750
- Publication date Jun 17, 2004
- CHIPWORKS
- David F. Skoll
- G06 - COMPUTING CALCULATING COUNTING
Information Patent Application
Design analysis workstation for analyzing integrated circuits
- Publication number 20020046386
- Publication date Apr 18, 2002
- Chipworks
- David F. Skoll
- G06 - COMPUTING CALCULATING COUNTING