Terry Reiss

Follow

Person

San Jose, CA, US

People

Patents Grantslast 30 patents

Information Patent Grant
Integration of fault detection with run-to-run control
- Patent number 7,337,019
- Issue date Feb 26, 2008
- Applied Materials, Inc.
- Terry P. Reiss
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Wafer fabrication data acquisition and management systems
- Patent number 6,952,656
- Issue date Oct 4, 2005
- Applied Materials, Inc.
- Sherry Cordova
- G05 - CONTROLLING REGULATING
Information Patent Grant
Fault detection and virtual sensor methods for tool fault monitoring
- Patent number 6,895,293
- Issue date May 17, 2005
- Applied Materials, Inc.
- Terry Reiss
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Run-to-run control over semiconductor processing tool based upon mi...
- Patent number 6,625,513
- Issue date Sep 23, 2003
- Applied Materials, Inc.
- Dimitris Lymberopoulos
- Y02 - TECHNOLOGIES OR APPLICATIONS FOR MITIGATION OR ADAPTATION AGAINST CLIMA...
Information Patent Grant
Defect reference system automatic pattern classification
- Patent number 6,466,895
- Issue date Oct 15, 2002
- Applied Materials, Inc.
- Stefanie Harvey
- G05 - CONTROLLING REGULATING

Patents Applicationslast 30 patents

Information Patent Application
Integration of fault detection with run-to-run control
- Publication number 20030014145
- Publication date Jan 16, 2003
- APPLIED MATERIALS, INC.
- Terry P. Reiss
- G05 - CONTROLLING REGULATING
Information Patent Application
Fault detection and virtual sensor methods for tool fault monitoring
- Publication number 20020055801
- Publication date May 9, 2002
- APPLIED MATERIALS, INC.
- Terry Reiss
- G05 - CONTROLLING REGULATING