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Terry Sinclair Connacher
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Tempe, AZ, US
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last 30 patents
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Patent Grant
Thermal control wafer with integrated heating-sensing elements
Patent number
12,085,609
Issue date
Sep 10, 2024
AEM SINGAPORE PTE. LTD.
Carl L. Ostrowski
G01 - MEASURING TESTING
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Patent Grant
Thermal control wafer with integrated heating-sensing elements
Patent number
12,013,432
Issue date
Jun 18, 2024
AEM SINGAPORE PTE. LTD.
Carl L. Ostrowski
G01 - MEASURING TESTING
Information
Patent Grant
Multiplexed thermal control wafer and coldplate
Patent number
12,000,885
Issue date
Jun 4, 2024
AEM SINGAPORE PTE. LTD.
Samer Kabbani
G01 - MEASURING TESTING
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Patent Grant
Integrated heater and temperature measurement
Patent number
11,828,796
Issue date
Nov 28, 2023
AEM Holdings Ltd.
Carl L. Ostrowski
G01 - MEASURING TESTING